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name:-0.0055270195007324
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Van Kemenade; Marc Patent Filings

Van Kemenade; Marc

Patent Applications and Registrations

Patent applications and USPTO patent grants for Van Kemenade; Marc.The latest application filed is for "laser-driven photon source and inspection apparatus including such a laser-driven photon source".

Company Profile
0.6.5
  • Van Kemenade; Marc - Veldhoven NL
  • Van Kemenade; Marc - Waalre NL
  • Van Kemenade; Marc - Eindhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Laser-driven photon source and inspection apparatus including such a laser-driven photon source
Grant 10,948,421 - Van Heumen , et al. March 16, 2
2021-03-16
Laser-Driven Photon Source and Inspection Apparatus Including such a Laser-Driven Photon Source
App 20170241914 - VAN HEUMEN; Martijn Petrus Christianus ;   et al.
2017-08-24
Lithographic apparatus and device manufacturing method to determine improved absolute position of exposure fields using mark structures
Grant 8,908,152 - Bijnen , et al. December 9, 2
2014-12-09
Lithographic apparatus and device manufacturing method
Grant 8,711,329 - Van Kemenade April 29, 2
2014-04-29
Method Of Calculating Model Parameters Of A Substrate, A Lithographic Apparatus And An Apparatus For Controlling Lithographic Processing By A Lithographic Apparatus
App 20120218533 - LYULINA; Irina ;   et al.
2012-08-30
Alignment mark and a method of aligning a substrate comprising such an alignment mark
Grant 8,208,121 - Bijnen , et al. June 26, 2
2012-06-26
Lithographic Apparatus and Device Manufacturing Method
App 20120057142 - Van Kemenade; Marc
2012-03-08
Lithographic Apparatus and Device Manufacturing Method
App 20100123886 - BIJNEN; Franciscus Godefridus Casper ;   et al.
2010-05-20
Alignment Mark and a Method of Aligning a Substrate Comprising Such an Alignment Mark
App 20090195768 - Bijnen; Franciscus Godefridus Casper ;   et al.
2009-08-06

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