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Patent applications and USPTO patent grants for Van Horn; Jody.The latest application filed is for "integrated circuit testing methods using well bias modification".
Patent | Date |
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Integrated circuit testing methods using well bias modification Grant 7,759,960 - Gattiker , et al. July 20, 2 | 2010-07-20 |
Integrated circuit testing methods using well bias modification Grant 7,564,256 - Gattiker , et al. July 21, 2 | 2009-07-21 |
Integrated circuit testing method using well bias modification Grant 7,486,098 - Gattiker , et al. February 3, 2 | 2009-02-03 |
Integrated Circuit Testing Methods Using Well Bias Modification App 20080211530 - Gattiker; Anne E. ;   et al. | 2008-09-04 |
Integrated circuit testing methods using well bias modification Grant 7,400,162 - Gattiker , et al. July 15, 2 | 2008-07-15 |
Integrated Circuit Testing Methods Using Well Bias Modification App 20080036486 - Gattiker; Anne E. ;   et al. | 2008-02-14 |
Integrated circuit testing methods using well bias modification App 20060071653 - Gattiker; Anne E. ;   et al. | 2006-04-06 |
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