van Gils; Karel

Patent Applications and Registrations

Patent applications and USPTO patent grants for van Gils; Karel.The latest application filed is for "method and system for optical three dimensional topography measurement".

Company Profile

1.6.6

van Gils; Karel - Blanden BE
Van Gils; Karel - Heverlee BE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for optical three dimensional topography measurement Grant 11,287,248 - Zhao , et al. March 29, 2	2022-03-29
Method and System for Optical Three Dimensional Topography Measurement App 20200217651 - Zhao; Guoheng ; et al.	2020-07-09
Method and system for optical three dimensional topography measurement Grant 10,634,487 - Zhao , et al.	2020-04-28
Method and System for Optical Three Dimensional Topography Measurement App 20180209784 - Zhao; Guoheng ; et al.	2018-07-26
Image acquisition system, image acquisition method, and inspection system Grant 9,886,764 - Zhao , et al. February 6, 2	2018-02-06
Apparatus and method for automatic pitch conversion of pick and place heads, pick and place head and pick and place device Grant 9,776,334 - Vangilbergen , et al. October 3, 2	2017-10-03
Image Acquisition System, Image Acquisition Method, And Inspection System App 20160048969 - ZHAO; Guoheng ; et al.	2016-02-18
Apparatus And Method For Automatic Pitch Conversion Of Pick And Place Heads, Pick And Place Head And Pick And Place Device App 20140271084 - Vangilbergen; Bert ; et al.	2014-09-18
Apparatus And Method For Three Dimensional Inspection Of Wafer Saw Marks App 20120300039 - Maison; Benoit ; et al.	2012-11-29
Method and an apparatus for measuring positions of contact elements of an electronic component Grant 7,423,743 - Smets , et al. September 9, 2	2008-09-09
Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two cameras Grant 6,778,282 - Smets , et al. August 17, 2	2004-08-17
Method and an apparatus for measuring positions of contact elements of an electronic component App 20040085549 - Smets, Carl ; et al.	2004-05-06

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