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Van Duinen; Gijs Patent Filings

Van Duinen; Gijs

Patent Applications and Registrations

Patent applications and USPTO patent grants for Van Duinen; Gijs.The latest application filed is for "cryogenic cell for mounting a specimen in a charged particle microscope".

Company Profile
2.4.4
  • Van Duinen; Gijs - Utrecht NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Cryogenic cell for mounting a specimen in a charged particle microscope
Grant 10,651,007 - Van De Water , et al.
2020-05-12
Cryogenic Cell For Mounting A Specimen In A Charged Particle Microscope
App 20190131105 - VAN DE WATER; Gerbert Jeroen ;   et al.
2019-05-02
Aligning a featureless thin film in a TEM
Grant 9,583,303 - Buijsse , et al. February 28, 2
2017-02-28
Aligning A Featureless Thin Film In A Tem
App 20160104596 - Buijsse; Bart ;   et al.
2016-04-14
Method of investigating the wavefront of a charged-particle beam
Grant 9,202,670 - Janssen , et al. December 1, 2
2015-12-01
Method of investigating and correcting aberrations in a charged-particle lens system
Grant 9,136,087 - Lazic , et al. September 15, 2
2015-09-15
Method Of Investigating The Wavefront Of A Charged-particle Beam
App 20150170876 - Janssen; Bart Jozef ;   et al.
2015-06-18
Method of Investigating and Correcting Aberrations in a Charged-Particle Lens System
App 20140061464 - Lazic; Ivan ;   et al.
2014-03-06

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