loadpatents
name:-0.021898984909058
name:-0.026901960372925
name:-0.0011341571807861
Van Der Werf; Jan Evert Patent Filings

Van Der Werf; Jan Evert

Patent Applications and Registrations

Patent applications and USPTO patent grants for Van Der Werf; Jan Evert.The latest application filed is for "optical read-out".

Company Profile
0.23.18
  • Van Der Werf; Jan Evert - Waalre NL
  • Van Der Werf; Jan Evert - Eindhoven NL
  • Van Der Werf; Jan Evert - Waarle NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device manufacturing method, lithographic apparatus and device manufactured thereby
Grant 7,630,060 - Ottens , et al. December 8, 2
2009-12-08
Lithographic apparatus and device manufacturing method
Grant 7,505,116 - Van Der Werf , et al. March 17, 2
2009-03-17
Holographic mask for lithographic apparatus and device manufacturing method
Grant 7,499,149 - Hendriks , et al. March 3, 2
2009-03-03
Device manufacturing method, device manufactured thereby and a mask for use in the method
Grant 7,492,443 - Van Der Werf , et al. February 17, 2
2009-02-17
Optical Read-out
App 20090041077 - Andersen; Ole Klembt ;   et al.
2009-02-12
Lithographic apparatus, device manufacturing method, and device manufactured thereby
Grant 7,459,690 - Van Der Werf , et al. December 2, 2
2008-12-02
Apparatus and method for inspecting a patterned part of a sample
Grant 7,453,577 - Van Der Werf , et al. November 18, 2
2008-11-18
Device manufacturing method, lithographic apparatus and device manufactured thereby
App 20080212053 - Ottens; Joost Jeroen ;   et al.
2008-09-04
Lithographic apparatus, device manufacturing method and radiation system
Grant 7,309,869 - Kurt , et al. December 18, 2
2007-12-18
Method of detecting mask defects, a computer program and reference substrate
Grant 7,307,712 - Van Der Werf , et al. December 11, 2
2007-12-11
Alignment system and lithographic apparatus equipped with such an alignment system
Grant 7,283,236 - Presura , et al. October 16, 2
2007-10-16
Method of measuring overlay
Grant 7,277,185 - Monshouwer , et al. October 2, 2
2007-10-02
Optical pick-up unit
App 20070115782 - Andersen; Ole Klembt ;   et al.
2007-05-24
Alignment of Holographic Images on Detector
App 20070103753 - Liedenbaum; Coen Theodorus Hubertus ;   et al.
2007-05-10
Lithographic apparatus, device manufacturing method and radiation system
Grant 7,105,837 - Kurt , et al. September 12, 2
2006-09-12
Method of measuring alignment of a substrate with respect to a reference alignment mark
Grant 7,095,499 - Monshouwer , et al. August 22, 2
2006-08-22
Lithographic apparatus, device manufacturing method, and device manufactured thereby
Grant 7,075,620 - Van Der Werf , et al. July 11, 2
2006-07-11
Inspection apparatus, sample and inspection method
App 20060126074 - Van Der Werf; Jan Evert ;   et al.
2006-06-15
Lithographic apparatus and device manufacturing method
Grant 7,012,673 - Kolesnychenko , et al. March 14, 2
2006-03-14
Alignment system and lithographic apparatus equipped with such an alignment system
App 20060001879 - Presura; Cristian ;   et al.
2006-01-05
Lithographic apparatus and device manufacturing method
App 20050280795 - Van Der Werf, Jan Evert ;   et al.
2005-12-22
Lithographic apparatus, device manufacturing method and radiation system
App 20050253091 - Kurt, Ralph ;   et al.
2005-11-17
Lithographic apparatus and device manufacturing method
Grant 6,963,391 - Van Der Werf , et al. November 8, 2
2005-11-08
Method of measuring alignment of a substrate with respect to a reference alignment mark
App 20050231698 - Monshouwer, Rene ;   et al.
2005-10-20
Method of measuring overlay
App 20050231732 - Monshouwer, Rene ;   et al.
2005-10-20
Method of measuring alignment of a substrate with respect to a reference alignment mark
Grant 6,937,334 - Monshouwer , et al. August 30, 2
2005-08-30
Method of measuring overlay
Grant 6,937,344 - Monshouwer , et al. August 30, 2
2005-08-30
Lithographic apparatus, device manufacturing method, and device manufactured thereby
Grant 6,888,151 - Kroon , et al. May 3, 2
2005-05-03
Device manufacturing method, device manufactured thereby and a mask for use in the method
Grant 6,879,374 - Van Der Werf , et al. April 12, 2
2005-04-12
Lithographic apparatus, device manufacturing method, and mask
App 20050019675 - Hendriks, Bernardus Hendrikus Wilhelmus ;   et al.
2005-01-27
Lithographic apparatus and device manufacturing method
App 20050002004 - Kolesnychenko, Aleksey Yurievich ;   et al.
2005-01-06
Lithographic apparatus, device manufacturing method, and device manufactured thereby
App 20040211922 - Kroon, Mark ;   et al.
2004-10-28
Lithographic apparatus and device manufacturing method
App 20040189966 - Van Der Werf, Jan Evert ;   et al.
2004-09-30
Lithographic apparatus, device manufacturing method, and device manufactured thereby
Grant 6,747,282 - Kroon , et al. June 8, 2
2004-06-08
Lithographic apparatus, device manufacturing method, and device manufactured thereby
App 20030001107 - Kroon, Mark ;   et al.
2003-01-02
Device manufacturing method, device manufactured thereby and a mask for use in the method
App 20030003383 - Van Der Werf, Jan Evert ;   et al.
2003-01-02
Method of measuring overlay
App 20020080364 - Monshouwer, Rene ;   et al.
2002-06-27
Method of measuring alignment of a substrate with respect to a reference alignment mark
App 20020080365 - Monshouwer, Rene ;   et al.
2002-06-27
Arrangement including a gas and/or vapor discharge lamp
Grant 4,051,407 - van der Werf , et al. September 27, 1
1977-09-27
Gas-and/or vapor discharge lamp
Grant 4,004,171 - Heuvelmans , et al. January 18, 1
1977-01-18
Device provided with a gas and/or vapor discharge tube
Grant 4,001,633 - van Tongeren , et al. January 4, 1
1977-01-04

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