VAN DER SANDEN; Stefan Cornelis Theodorus

Patent Applications and Registrations

Patent applications and USPTO patent grants for VAN DER SANDEN; Stefan Cornelis Theodorus.The latest application filed is for "methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus".

Company Profile

3.10.13

VAN DER SANDEN; Stefan Cornelis Theodorus - Nijmegen NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods Of Determining Corrections For A Patterning Process, Device Manufacturing Method, Control System For A Lithographic Apparatus And Lithographic Apparatus App 20220229373 - KOU; Weitian ; et al.	2022-07-21
Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus Grant 11,327,407 - Kou , et al. May 10, 2	2022-05-10
Lithographic Method And Lithographic Apparatus App 20220011681 - CEKLI; Hakki Ergun ; et al.	2022-01-13
Lithographic method and lithographic apparatus Grant 11,156,923 - Cekli , et al. October 26, 2	2021-10-26
Method and apparatus for design of a metrology target Grant 11,003,099 - Van Der Schaar , et al. May 11, 2	2021-05-11
Methods Of Determining Corrections For A Patterning Process, Device Manufacturing Method, Control System For A Lithographic Apparatus And Lithographic Apparatus App 20210080836 - KOU; Weitian ; et al.	2021-03-18
Methods of determining corrections for a patterning process Grant 10,877,381 - Kou , et al. December 29, 2	2020-12-29
Method and Apparatus for Design of a Metrology Target App 20200033741 - Van Der Schaar; Maurits ; et al.	2020-01-30
Methods Of Determining Corrections For A Patterning Process App 20200019067 - KOU; Weitian ; et al.	2020-01-16
Method and apparatus for design of a metrology target Grant 10,437,163 - Van Der Schaar , et al. O	2019-10-08
Lithographic Method And Lithographic Apparatus App 20180292761 - CEKLI; Hakki Ergun ; et al.	2018-10-11
Lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Grant 10,025,193 - Cekli , et al. July 17, 2	2018-07-17
Method and Apparatus for Design of a Metrology Target App 20180017881 - VAN DER SCHAAR; Maurits ; et al.	2018-01-18
Deformation pattern recognition method, pattern transferring method, processing device monitoring method, and lithographic apparatus Grant 9,753,377 - Cekli , et al. September 5, 2	2017-09-05
Lithographic Apparatus, Device Manufacturing Method And Associated Data Processing Apparatus And Computer Program Product App 20160334712 - CEKLI; Hakki Ergun ; et al.	2016-11-17
Method of applying a pattern to a substrate, device manufacturing method and lithographic apparatus for use in such methods Grant 9,291,916 - Van Der Sanden , et al. March 22, 2	2016-03-22
Deformation Pattern Recognition Method, Pattern Transferring Method, Processing Device Monitoring Method, And Lithographic Apparatus App 20150205213 - Cekli; Hakki Ergun ; et al.	2015-07-23
Method of Applying a Pattern to a Substrate, Device Manufacturing Method and Lithographic Apparatus for Use in Such Methods App 20150153656 - VAN DER SANDEN; Stefan Cornelis Theodorus ; et al.	2015-06-04
Method of applying a pattern to a substrate, device manufacturing method and lithographic apparatus for use in such methods Grant 8,976,355 - Van Der Sanden , et al. March 10, 2	2015-03-10
Method of Applying a Pattern to a Substrate, Device Manufacturing Method and Lithographic Apparatus for Use in Such Methods App 20130230797 - VAN DER SANDEN; Stefan Cornelis Theodorus ; et al.	2013-09-05
Method Of Calculating Model Parameters Of A Substrate, A Lithographic Apparatus And An Apparatus For Controlling Lithographic Processing By A Lithographic Apparatus App 20120218533 - LYULINA; Irina ; et al.	2012-08-30

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.