VAN DER POST; Sietse Thijmen

Patent Applications and Registrations

Patent applications and USPTO patent grants for VAN DER POST; Sietse Thijmen.The latest application filed is for "manufacturing a reflective diffraction grating".

Company Profile

11.10.15

VAN DER POST; Sietse Thijmen - Utrecht NL
- Utrecht NL
Van Der Post; Sietse Thijmen - Amsterdam NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Manufacturing A Reflective Diffraction Grating App 20220221629 - NIENHUYS; Han-Kwang ; et al.	2022-07-14
Reflector Manufacturing Method And Associated Reflector App 20220134693 - ROOBOL; Sander Bas ; et al.	2022-05-05
Wavefront Sensor And Associated Metrology Apparatus App 20220099498 - VAN DER POST; Sietse Thijmen ; et al.	2022-03-31
Method and apparatus for deriving corrections, method and apparatus for determining a property of a structure, device manufacturing method Grant 11,243,470 - Kumar , et al. February 8, 2	2022-02-08
Optical systems, metrology apparatus and associated method Grant 10,725,381 - Van Der Post , et al.	2020-07-28
Method of determining a property of a structure, inspection apparatus and device manufacturing method Grant 10,712,673 - Van Der Post , et al.	2020-07-14
Method and apparatus for determining alignment properties of a beam of radiation Grant 10,613,448 - Van Der Post	2020-04-07
Method and apparatus for inspection and metrology Grant 10,578,979 - Van Der Post , et al.	2020-03-03
Method Of Determining A Property Of A Structure, Inspection Apparatus And Device Manufacturing Method App 20190361360 - VAN DER POST; Sietse Thijmen ; et al.	2019-11-28
Method of optimizing the position and/or size of a measurement illumination spot relative to a target on a substrate, and associated apparatus Grant 10488765 -	2019-11-26
Illumination source for an inspection apparatus, inspection apparatus and inspection method Grant 10,451,559 - Van Voorst , et al. Oc	2019-10-22
Method And Apparatus For Inspection And Metrology App 20190212655 - VAN DER POST; Sietse Thijmen ; et al.	2019-07-11
Method And Apparatus For Deriving Corrections, Method And Apparatus For Determining A Property Of A Structure, Device Manufactur App 20190212660 - KUMAR; Nitish ; et al.	2019-07-11
Illumination source for an inspection apparatus, inspection apparatus and inspection method Grant 10,330,606 - Van Voorst , et al.	2019-06-25
Method of Optimizing the Position and/or Size of a Measurement Illumination Spot Relative to a Target on a Substrate, and Associated Apparatus App 20190107786 - VAN BOXMEER; Johan Maria ; et al.	2019-04-11
Method and Apparatus for Determining Alignment Properties of a Beam of Radiation App 20190101840 - VAN DER POST; Sietse Thijmen	2019-04-04
Method and apparatus for inspection and metrology Grant 10,248,029 - Van Der Post , et al.	2019-04-02
Optical Systems, Metrology Apparatus and Associated Method App 20190072853 - VAN DER POST; Sietse Thijmen ; et al.	2019-03-07
Illumination Source for an Inspection Apparatus, Inspection Apparatus and Inspection Method App 20190003981 - Van Voorst; Peter Danny ; et al.	2019-01-03
Method and apparatus for inspection and metrology Grant 10,126,659 - Zijp , et al. November 13, 2	2018-11-13
Methods and Apparatus for Predicting Performance of a Measurement Method, Measurement Method and Apparatus App 20180254597 - VAN DER POST; Sietse Thijmen ; et al.	2018-09-06
Method And Apparatus For Inspection And Metrology App 20180188658 - VAN DER POST; Sietse Thijmen ; et al.	2018-07-05
Illumination Source for an Inspection Apparatus, Inspection Apparatus and Inspection Method App 20180073992 - VAN VOORST; Peter Danny ; et al.	2018-03-15
Method and apparatus for inspection and metrology Grant 9,851,246 - Van Der Post December 26, 2	2017-12-26
Method And Apparatus For Inspection And Metrology App 20170102620 - ZIJP; Ferry ; et al.	2017-04-13
Method And Apparatus For Inspection And Metrology App 20160258810 - VAN DER POST; Sietse Thijmen	2016-09-08

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