van der Mast; Karel D.
Patent Applications and Registrations
Patent applications and USPTO patent grants for van der Mast; Karel D..The latest application filed is for "collection of secondary electrons through the objective lens of a scanning electron microscope".
- van der Mast; Karel D. - Portland OR
- van der Mast; Karel D. - Helmond NL
- van der Mast; Karel D. - Eindhoven NL
- van der Mast; Karel D. - Pijnacker NL
| Patent | Date |
|---|---|
| Collection of secondary electrons through the objective lens of a scanning electron microscope Grant 6,946,654 - Gerlach , et al. September 20, 2 | 2005-09-20 |
| Environmental SEM with a magnetic field for improved secondary electron direction Grant 6,365,896 - van der Mast April 2, 2 | 2002-04-02 |
| Collection of secondary electrons through the objective lens of a scanning electron microscope App 20020024013 - Gerlach, Robert L. ; et al. | 2002-02-28 |
| Correction device for correcting chromatic aberration in particle-optical apparatus Grant 5,986,269 - Krijn , et al. November 16, 1 | 1999-11-16 |
| Particle-optical apparatus comprising a detector for secondary electrons Grant 5,578,822 - Van Der Mast , et al. November 26, 1 | 1996-11-26 |
| Electron beam apparatus Grant 5,336,885 - Rose , et al. August 9, 1 | 1994-08-09 |
| Charged particle beam device Grant 5,221,844 - van der Mast , et al. June 22, 1 | 1993-06-22 |
| Charged-particle beam apparatus Grant 5,001,349 - van der Mast March 19, 1 | 1991-03-19 |
| Electron beam apparatus comprising a semiconductor electron emitter Grant 4,871,911 - Van Gorkom , et al. October 3, 1 | 1989-10-03 |
| Method of beam centering Grant 4,820,921 - Bakker , et al. April 11, 1 | 1989-04-11 |
| Apparatus for energy-selective visualization Grant 4,789,780 - Le Poole , et al. December 6, 1 | 1988-12-06 |
| Semiconductor device having a cold cathode Grant 4,766,340 - van der Mast , et al. August 23, 1 | 1988-08-23 |
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