van den Boogaard; Mathijs Petrus Wilhelmus
Patent Applications and Registrations
Patent applications and USPTO patent grants for van den Boogaard; Mathijs Petrus Wilhelmus.The latest application filed is for "sample holder for a charged particle microscope".
- van den Boogaard; Mathijs Petrus Wilhelmus - Eindhoven NL
- van den Boogaard; Mathijs Petrus Wilhelmus - Boxtel NL
| Patent | Date |
|---|---|
| Sample holder for a charged particle microscope Grant 11,251,014 - van den Boogaard , et al. February 15, 2 | 2022-02-15 |
| Method of analyzing surface modification of a specimen in a charged-particle microscope Grant 10,811,223 - Potocek , et al. October 20, 2 | 2020-10-20 |
| Sample Holder For A Charged Particle Microscope App 20200273659 - van den Boogaard; Mathijs Petrus Wilhelmus ; et al. | 2020-08-27 |
| Method Of Analyzing Surface Modification Of A Specimen In A Charged-particle Microscope App 20190051492 - Potocek; Pavel ; et al. | 2019-02-14 |
| Method of analyzing surface modification of a specimen in a charged-particle microscope Grant 10,115,561 - Potocek , et al. October 30, 2 | 2018-10-30 |
| Method Of Analyzing Surface Modification Of A Specimen In A Charged-particle Microscope App 20160365224 - Potocek; Pavel ; et al. | 2016-12-15 |
| Sample preparation stage Grant 8,754,384 - Persoon , et al. June 17, 2 | 2014-06-17 |
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