VAN DE VEN; Wendy Johanna Martina
Patent Applications and Registrations
Patent applications and USPTO patent grants for VAN DE VEN; Wendy Johanna Martina.The latest application filed is for "method of obtaining measurements, apparatus for performing a process step, and metrology apparatus".
- VAN DE VEN; Wendy Johanna Martina - Heesch NL
| Patent | Date |
|---|---|
| Method Of Obtaining Measurements, Apparatus For Performing A Process Step, And Metrology Apparatus App 20220035259 - CEKLI; Hakki Ergun ; et al. | 2022-02-03 |
| Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus Grant 11,175,591 - Cekli , et al. November 16, 2 | 2021-11-16 |
| Lithographic method Grant 11,029,610 - Tinnemans , et al. June 8, 2 | 2021-06-08 |
| Lithographic method Grant 10,962,887 - Tinnemans , et al. March 30, 2 | 2021-03-30 |
| Lithographic Method App 20200272061 - TINNEMANS; Patricius Aloysius Jacobus ; et al. | 2020-08-27 |
| Lithographic Method App 20200081356 - TINNEMANS; Patricius Aloysius Jacobus ; et al. | 2020-03-12 |
| Lithographic method Grant 10,527,958 - Tinnemans , et al. J | 2020-01-07 |
| Lithographic Method App 20190094721 - TINNEMANS; Patricius Aloysius Jacobus ; et al. | 2019-03-28 |
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