Van Brug; Hedser

Patent Applications and Registrations

Patent applications and USPTO patent grants for Van Brug; Hedser.The latest application filed is for "a focal in-field pointing telescope system".

Company Profile

5.11.10

Van Brug; Hedser - The Hague NL
van Brug; Hedser - 's-Gravenhage NL
VAN BRUG; Hedser - Den Haag NL
Van Brug; Hedser - Gravenhage NL
van Brug, Hedser - Den Hagg NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Interferometer system and use thereof Grant 11,143,498 - Visser , et al. October 12, 2	2021-10-12
A Focal In-field Pointing Telescope System App 20210263292 - VISSER; Huibert ; et al.	2021-08-26
Correction of curved projection of a spectrometer slit line Grant 11,067,441 - Visser , et al. July 20, 2	2021-07-20
Spatially resolved aerosol detection Grant 10,578,545 - van Brug , et al.	2020-03-03
High resolution broadband monolithic spectrometer and method Grant 10,508,951 - Kruizinga , et al. Dec	2019-12-17
Correction Of Curved Projection Of A Spectrometer Slit Line App 20190368926 - VISSER; Huibert ; et al.	2019-12-05
Spatially resolved gas detection Grant 10,473,526 - Visser , et al. Nov	2019-11-12
Interferometer System And Use Thereof App 20190323821 - VISSER; Huibert ; et al.	2019-10-24
High Resolution Broadband Monolithic Spectrometer And Method App 20190017869 - KRUIZINGA; Borgert ; et al.	2019-01-17
Spatially Resolved Gas Detection App 20180283949 - Visser; Huibert ; et al.	2018-10-04
Spatially Resolved Aerosol Detection App 20180284013 - van Brug; Hedser ; et al.	2018-10-04
Inspection apparatus, lithographic system provided with the inspection apparatus and a method for inspecting a sample Grant 8,064,038 - Brouwer , et al. November 22, 2	2011-11-22
Illumination of a patterning device based on interference for use in a maskless lithography system Grant 7,768,627 - Visser , et al. August 3, 2	2010-08-03
Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object Grant 7,697,128 - Snel , et al. April 13, 2	2010-04-13
Lithographic apparatus and method Grant 7,522,263 - Van Mierlo , et al. April 21, 2	2009-04-21
Method for measuring contour variations Grant 7,471,398 - Saunders , et al. December 30, 2	2008-12-30
Illumination of a Patterning Device Based on Interference for Use in a Maskless Lithography System App 20080309906 - Visser; Huibert ; et al.	2008-12-18
Inspection apparatus, lithographic system provided with the inspection apparatus and a method for inspecting a sample App 20070146695 - Brouwer; Egbert Anne Martijn ; et al.	2007-06-28
Method and apparatus for polishing a workpiece surface Grant 7,121,922 - van Brug October 17, 2	2006-10-17
Apparatus and method for manufacturing or working optical elements and/or optical forming elements, and such element App 20060079157 - Van Brug; Hedser ; et al.	2006-04-13
Method and apparatus for polishing a workpiece surface App 20050009447 - van Brug, Hedser	2005-01-13

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