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Patent applications and USPTO patent grants for van Beek; Cornelis G..The latest application filed is for "electron microscope with integrated detector(s)".
Patent | Date |
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Electron microscope with integrated detector(s) Grant 8,987,665 - Schamber , et al. March 24, 2 | 2015-03-24 |
Electron Microscope with Integrated Detector(s) App 20130299698 - Schamber; Frederick H. ;   et al. | 2013-11-14 |
Apparatus for correlating an optical image and a SEM image and method of use thereof Grant RE44,035 - Schamber , et al. March 5, 2 | 2013-03-05 |
Electron microscope with integrated detector(s) Grant 8,334,511 - Schamber , et al. December 18, 2 | 2012-12-18 |
Electron Microcope Whith Integrated Detector(s) App 20110204229 - Schamber; Frederick H ;   et al. | 2011-08-25 |
Particle detection auditing system and method Grant 7,476,858 - Schamber , et al. January 13, 2 | 2009-01-13 |
Particle detection auditing system and method App 20070114407 - Schamber; Frederick H. ;   et al. | 2007-05-24 |
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