loadpatents
name:-0.0094070434570312
name:-0.0057311058044434
name:-0.0005180835723877
Valverde; Charles Patent Filings

Valverde; Charles

Patent Applications and Registrations

Patent applications and USPTO patent grants for Valverde; Charles.The latest application filed is for "metrology in electroless cobalt plating".

Company Profile
0.6.10
  • Valverde; Charles - Ansonia CT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Manufacture of electroless cobalt deposition compositions for microelectronics applications
Grant 7,704,306 - Chen , et al. April 27, 2
2010-04-27
Defectivity and process control of electroless deposition in microelectronics applications
Grant 7,615,491 - Chen , et al. November 10, 2
2009-11-10
Defectivity and process control of electroless deposition in microelectronics applications
Grant 7,611,987 - Chen , et al. November 3, 2
2009-11-03
Defectivity and process control of electroless deposition in microelectronics applications
Grant 7,611,988 - Chen , et al. November 3, 2
2009-11-03
Metrology In Electroless Cobalt Plating
App 20090155468 - Petrov; Nicolai ;   et al.
2009-06-18
Self-initiated Alkaline Metal Ion Free Electroless Deposition Composition For Thin Co-based And Ni-based Alloys
App 20080254205 - Petrov; Nicolai ;   et al.
2008-10-16
Defectivity and process control of electroless deposition in microelectronics applications
Grant 7,410,899 - Chen , et al. August 12, 2
2008-08-12
Manufacture Of Electroless Cobalt Deposition Compositions For Microelectronics Applications
App 20080090414 - Chen; Qingyun ;   et al.
2008-04-17
Cobalt and nickel electroless plating in microelectronic devices
Grant 7,332,193 - Valverde , et al. February 19, 2
2008-02-19
Defectivity and process control of electroless deposition in microelectronics applications
App 20070062408 - Chen; Qingyun ;   et al.
2007-03-22
Defectivity and process control of electroless deposition in microelectronics applications
App 20070066059 - Chen; Qingyun ;   et al.
2007-03-22
Defectivity and process control of electroless deposition in microelectronics applications
App 20070066057 - Chen; Qingyun ;   et al.
2007-03-22
Defectivity and process control of electroless deposition in microelectronics applications
App 20070066058 - Chen; Qingyun ;   et al.
2007-03-22
Cobalt electroless plating in microelectronic devices
App 20060280860 - Paneccasio; Vincent JR. ;   et al.
2006-12-14
Cobalt self-initiated electroless via fill for stacked memory cells
App 20060188659 - Chen; Qingyun ;   et al.
2006-08-24
Cobalt and nickel electroless plating in microelectronic devices
App 20060083850 - Valverde; Charles ;   et al.
2006-04-20

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed