loadpatents
name:-0.011929988861084
name:-0.0074450969696045
name:-0.0026650428771973
Valcore; John Patent Filings

Valcore; John

Patent Applications and Registrations

Patent applications and USPTO patent grants for Valcore; John.The latest application filed is for "active feedback control of subsystems of a process module".

Company Profile
2.7.9
  • Valcore; John - Fremont CA
  • Valcore; John - San Jose CA US
  • Valcore; John - Mountain View CA US
  • Valcore; John - Rochester NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Active feedback control of subsystems of a process module
Grant 10,366,869 - Riggs , et al. July 30, 2
2019-07-30
Active Feedback Control Of Subsystems Of A Process Module
App 20190157039 - Riggs; Scott ;   et al.
2019-05-23
Method and apparatus for measuring wafer bias potential
Grant 9,299,539 - Makhratchev , et al. March 29, 2
2016-03-29
System And Method For Monitoring Wafer Stress
App 20140083463 - Valcore; John ;   et al.
2014-03-27
Non-destructive signal propagation system and method to determine substrate integrity
Grant 8,508,239 - Valcore August 13, 2
2013-08-13
System and method for monitoring wafer stress
Grant 8,293,023 - Valcore , et al. October 23, 2
2012-10-23
System And Method For Wafer Carrier Vibration Reduction
App 20110094546 - Valcore; John ;   et al.
2011-04-28
System And Method For Monitoring Wafer Stress
App 20110094538 - Valcore; John ;   et al.
2011-04-28
Method And Apparatus For Measuring Wafer Bias Potential
App 20110043228 - Makhratchev; Konstantin ;   et al.
2011-02-24
Non-destructive Signal Propagation System And Method To Determine Substrate Integrity
App 20100283482 - Valcore; John
2010-11-11
Harmonic Derived Arc Detector
App 20100201371 - Valcore; John ;   et al.
2010-08-12
Harmonic derived arc detector
Grant 7,728,602 - Valcore , et al. June 1, 2
2010-06-01
Harmonic Derived Arc Detector
App 20080197854 - Valcore; John ;   et al.
2008-08-21

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