Vajaria; Himanshu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vajaria; Himanshu.The latest application filed is for "super-resolution defect review image generation through generative adversarial networks".

Company Profile

8.7.7

Vajaria; Himanshu - Milpitas CA
Vajaria; Himanshu - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Adaptive care areas for die-die inspection Grant 10,997,710 - Vajaria , et al. May 4, 2	2021-05-04
Super-resolution defect review image generation through generative adversarial networks Grant 10,949,964 - Pandey , et al. March 16, 2	2021-03-16
Super-Resolution Defect Review Image Generation Through Generative Adversarial Networks App 20200098101 - Pandey; Anuj ; et al.	2020-03-26
Multi-step image alignment method for large offset die-die inspection Grant 10,522,376 - Lauber , et al. Dec	2019-12-31
Feature selection and automated process window monitoring through outlier detection Grant 10,365,639 - Ghadar , et al. July 30, 2	2019-07-30
Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput Grant 10,290,088 - Vajaria , et al.	2019-05-14
Multi-step Image Alignment Method For Large Offset Die-die Inspection App 20190122913 - Lauber; Jan ; et al.	2019-04-25
Adaptive Care Areas For Die-die Inspection App 20190114758 - Vajaria; Himanshu ; et al.	2019-04-18
Automated inline inspection and metrology using shadow-gram images Grant 9,734,568 - Vajaria , et al. August 15, 2	2017-08-15
Feature Selection And Automated Process Window Monitoring Through Outlier Detection App 20170192411 - Ghadar; Shabnam ; et al.	2017-07-06
Automated image-based process monitoring and control Grant 9,569,834 - Vajaria , et al. February 14, 2	2017-02-14
Automated Image-based Process Monitoring And Control App 20160371826 - VAJARIA; Himanshu ; et al.	2016-12-22
Automated Inline Inspection And Metrology Using Shadow-gram Images App 20150243018 - VAJARIA; Himanshu ; et al.	2015-08-27
Wafer and Lot Based Hierarchical Method Combining Customized Metrics with a Global Classification Methodology to Monitor Process Tool Condition at Extremely High Throughput App 20150234379 - Vajaria; Himanshu ; et al.	2015-08-20

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