loadpatents
name:-0.015394926071167
name:-0.014344930648804
name:-0.00043916702270508
Vahey; Paul G. Patent Filings

Vahey; Paul G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vahey; Paul G..The latest application filed is for "apparatus and method for spectroscopic analysis of residue".

Company Profile
0.16.13
  • Vahey; Paul G. - Seattle WA
  • Vahey; Paul G - Seattle WA
  • Vahey; Paul G. - Seatle WA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods for spectroscopic analysis of residue
Grant 11,105,751 - Vahey August 31, 2
2021-08-31
Indicator device and method
Grant 10,871,405 - Vahey December 22, 2
2020-12-22
Apparatus and Method for Spectroscopic Analysis of Residue
App 20190227000 - Vahey; Paul G.
2019-07-25
Apparatus for spectroscopic analysis of residue
Grant 10,302,573 - Vahey
2019-05-28
Indicator Device And Method
App 20180348067 - VAHEY; Paul G.
2018-12-06
Multispectral imaging system and method for detecting foreign object debris
Grant 9,863,888 - Shelley, Jr. , et al. January 9, 2
2018-01-09
Multispectral Imaging System And Method For Detecting Foreign Object Debris
App 20170160208 - Shelley, JR.; Paul H. ;   et al.
2017-06-08
Apparatus and Method for Spectroscopic Analysis of Residue
App 20170146461 - Vahey; Paul G.
2017-05-25
Multispectral imaging system and method for detecting foreign object debris
Grant 9,606,070 - Shelley, Jr. , et al. March 28, 2
2017-03-28
Apparatus and method for spectroscopic analysis of residue
Grant 9,594,027 - Vahey March 14, 2
2017-03-14
Detection of chemical changes of system fluid via near infrared (NIR) spectroscopy
Grant 9,395,295 - Gaw , et al. July 19, 2
2016-07-19
Multispectral Imaging System And Method For Detecting Foreign Object Debris
App 20160146741 - Shelley, JR.; Paul H. ;   et al.
2016-05-26
Detection Of Chemical Changes Of System Fluid Via Near Infrared (nir) Spectroscopy
App 20160076998 - Gaw; Kevin O. ;   et al.
2016-03-17
Apparatus and Method for Spectroscopic Analysis of Residue
App 20150346110 - Vahey; Paul G.
2015-12-03
Resin detection system
Grant 8,853,634 - Shelley, Jr. , et al. October 7, 2
2014-10-07
Thermal effect measurement with mid-infrared spectroscopy
Grant 8,552,382 - Shelley , et al. October 8, 2
2013-10-08
Resin Detection System
App 20130234030 - Shelley, JR.; Paul H. ;   et al.
2013-09-12
Method of predicting thermal or chemical effect in a coated or painted composite material
Grant 8,436,311 - Shelley , et al. May 7, 2
2013-05-07
System and method for resin thickness measurement
Grant 8,338,787 - Shelley , et al. December 25, 2
2012-12-25
Authenticatable mark, systems for preparing and authenticating the mark
Grant 8,330,122 - Smith , et al. December 11, 2
2012-12-11
Application of crossed teflon diffuser to coatings on oriented surfaces
Grant 8,072,616 - Vahey , et al. December 6, 2
2011-12-06
Method of Predicting Thermal or Chemical Effect In A Coated Or Painted Composite Material
App 20110001047 - Shelley; Paul H. ;   et al.
2011-01-06
Thermal Effect Measurement with Mid-Infrared Spectroscopy
App 20100038544 - Shelley; Paul H. ;   et al.
2010-02-18
Authenticatable Mark, Systems For Preparing And Authenticating The Mark
App 20090141961 - Smith; Karl J. ;   et al.
2009-06-04
Application of crossed teflon diffuser to coatings on oriented surfaces
App 20080239284 - Vahey; Paul G. ;   et al.
2008-10-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed