Vagos; Pedro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vagos; Pedro.The latest application filed is for "vortex polarimeter".

Company Profile

4.10.9

Vagos; Pedro - Chennevieres FR
Vagos; Pedro - Bend OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Vortex Polarimeter App 20220170847 - James; Kenneth E. ; et al.	2022-06-02
Vortex polarimeter Grant 11,346,768 - James , et al. May 31, 2	2022-05-31
Correction of angular error of plane-of-incidence azimuth of optical metrology device Grant 10,621,264 - Vagos , et al.	2020-04-14
Correction Of Angular Error Of Plane-of-incidence Azimuth Of Optical Metrology Device App 20190272305 - VAGOS; Pedro ; et al.	2019-09-05
Correction of angular error of plane-of-incidence azimuth of optical metrology device Grant 10,296,554 - Vagos , et al.	2019-05-21
Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device Grant 10,274,367 - Shachaf , et al.	2019-04-30
Deconvolution To Reduce The Effective Spot Size Of A Spectroscopic Optical Metrology Device App 20180348055 - Shachaf; Amit ; et al.	2018-12-06
Optical metrology using differential fitting Grant 9,995,689 - Vagos June 12, 2	2018-06-12
Deconvolution to reduce the effective spot size of a spectroscopic optical metrology device Grant 9,958,327 - Shachaf , et al. May 1, 2	2018-05-01
Optical Metrology Using Differential Fitting App 20160341670 - Vagos; Pedro	2016-11-24
Deconvolution To Reduce The Effective Spot Size Of A Spectroscopic Optical Metrology Device App 20160097677 - Shachaf; Amit ; et al.	2016-04-07
Correction Of Angular Error Of Plane-of-incidence Azimuth Of Optical Metrology Device App 20140249768 - Vagos; Pedro ; et al.	2014-09-04
Mueller matrix spectroscopy using chiroptic Grant 8,427,645 - Vagos , et al. April 23, 2	2013-04-23
Mueller Matrix Spectroscopy Using Chiroptic App 20120176618 - Vagos; Pedro ; et al.	2012-07-12
Non-contact apparatus and method for measuring a property of a dielectric layer on a wafer Grant 7,751,061 - Vagos July 6, 2	2010-07-06
Apparatus and method for non-contact assessment of a constituent in semiconductor substrates Grant 7,410,815 - Vagos August 12, 2	2008-08-12
Non-Contact Apparatus and Method for Measuring a Property of a Dielectric Layer on a Wafer App 20080018882 - Vagos; Pedro	2008-01-24
Apparatus and method for non-contact assessment of a constituent in semiconductor substrates App 20070048948 - Vagos; Pedro	2007-03-01

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