Vaessen; Jean-Pierre Agnes Henricus Marie

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vaessen; Jean-Pierre Agnes Henricus Marie.The latest application filed is for "method of determining information about a patterning process, method of reducing error in measurement data, method of calibratin".

Company Profile

2.5.4

Vaessen; Jean-Pierre Agnes Henricus Marie - Echt NL
Vaessen; Jean-Pierre Agnes Henricus Marie - Veldhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targets Grant 11,022,897 - Venselaar , et al. June 1, 2	2021-06-01
Method of measuring a parameter of interest, inspection apparatus, lithographic system and device manufacturing method Grant 10,705,430 - Sanguinetti , et al.	2020-07-07
Measurement method, inspection apparatus, patterning device, lithographic system and device manufacturing method Grant 10,691,030 - Staals , et al.	2020-06-23
Measurement Method, Inspection Apparatus, Patterning Device, Lithographic System And Device Manufacturing Method App 20190171114 - STAALS; Frank ; et al.	2019-06-06
Method Of Determining Information About A Patterning Process, Method Of Reducing Error In Measurement Data, Method Of Calibratin App 20190171115 - VENSELAAR; Joannes Jitse ; et al.	2019-06-06
Method Of Measuring A Parameter Of Interest, Inspection Apparatus, Lithographic System And Device Manufacturing Method App 20180341182 - SANGUINETTI; Gonzalo Roberto ; et al.	2018-11-29
Inspection method and apparatus, lithographic system and device manufacturing method Grant 10,132,763 - Cramer , et al. November 20, 2	2018-11-20
Method of metrology, inspection apparatus, lithographic system and device manufacturing method Grant 9,958,789 - Wardenier , et al. May 1, 2	2018-05-01
Inspection Method and Apparatus, Lithographic System and Device Manufacturing Method App 20150177166 - Cramer; Hugo Augustinus Joseph ; et al.	2015-06-25

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