Utlaut; Mark W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Utlaut; Mark W..The latest application filed is for "high aspect ratio x-ray targets and uses of same".

Company Profile

1.38.38

Utlaut; Mark W. - Scappoose OR
Utlaut; Mark W. - Scappose OR
Utlaut; Mark W. - Saugus CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High aspect ratio X-ray targets and uses of same Grant 10,366,860 - Parker , et al. July 30, 2	2019-07-30
High Aspect Ratio X-ray Targets And Uses Of Same App 20180190467 - Parker; N. William ; et al.	2018-07-05
High aspect ratio x-ray targets and uses of same Grant 9,934,930 - Parker , et al. April 3, 2	2018-04-03
Lamella creation method and device using fixed-angle beam and rotating sample stage Grant 9,733,164 - Wells , et al. August 15, 2	2017-08-15
High voltage isolation of an inductively coupled plasma ion source with a liquid that is not actively pumped Grant 9,591,735 - Kellogg , et al. March 7, 2	2017-03-07
Adaptive Control For Charged Particle Beam Processing App 20170002467 - Straw; Marcus ; et al.	2017-01-05
Method for attachment of an electrode into an inductively-coupled plasma Grant 9,530,625 - Kellogg , et al. December 27, 2	2016-12-27
System and method for simultaneous detection of secondary electrons and light in a charged particle beam system Grant 9,494,516 - Parker , et al. November 15, 2	2016-11-15
Multi-source plasma focused ion beam system Grant 9,401,262 - Smith , et al. July 26, 2	2016-07-26
System and Method for Simultaneous Detection of Secondary Electrons and Light in a Charged Particle Beam System App 20150369737 - Parker; William ; et al.	2015-12-24
Method For Attachment Of An Electrode Into An Inductively-coupled Plasma App 20150357166 - Kellogg; Sean ; et al.	2015-12-10
Image-enhancing spotlight mode for digital microscopy Grant 9,204,036 - Bahm , et al. December 1, 2	2015-12-01
Multi-Source Plasma Focused Ion Beam System App 20150318140 - Smith; Noel ; et al.	2015-11-05
High Aspect Ratio X-ray Targets And Uses Of Same App 20150303021 - Parker; N. William ; et al.	2015-10-22
Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Grant 9,159,534 - Graupera , et al. October 13, 2	2015-10-13
System for attachment of an electrode into a plasma source Grant 9,053,895 - Kellogg , et al. June 9, 2	2015-06-09
Microfluidics delivery systems Grant 9,044,781 - Botman , et al. June 2, 2	2015-06-02
System and method for simultaneous detection of secondary electrons and light in a charged particle beam system Grant 9,040,909 - Parker , et al. May 26, 2	2015-05-26
Multi-source plasma focused ion beam system Grant 9,029,812 - Smith , et al. May 12, 2	2015-05-12
High Voltage Isolation of an Inductively Coupled Plasma Ion Source with a Liquid that is not Actively Pumped App 20150102230 - Kellogg; Sean ; et al.	2015-04-16
Encapsulation of electrodes in solid media Grant 8,987,678 - Kellogg , et al. March 24, 2	2015-03-24
Charged particle beam system aperture Grant 8,907,296 - Parker , et al. December 9, 2	2014-12-09
Multi-source Plasma Focused Ion Beam System App 20140312245 - Smith; Noel ; et al.	2014-10-23
Methods and Structures for Rapid Switching Between Different Process Gases in an Inductively-Coupled Plasma (ICP) Ion Source App 20140306607 - Graupera; Anthony ; et al.	2014-10-16
On-axis detector for charged particle beam system Grant 8,759,764 - Graupera , et al. June 24, 2	2014-06-24
Microfluidics Delivery Systems App 20140151335 - Botman; Aurelien Philipp Jean Maclou ; et al.	2014-06-05
System And Method For Simultaneous Detection Of Secondary Electrons And Light In A Charged Particle Beam System App 20140131573 - Parker; N. William ; et al.	2014-05-15
Multi-source plasma focused ion beam system Grant 8,692,217 - Smith , et al. April 8, 2	2014-04-08
Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolation Grant 8,642,974 - Kellogg , et al. February 4, 2	2014-02-04
Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (ICP) ion source Grant 8,633,452 - Graupera , et al. January 21, 2	2014-01-21
On-Axis Detector for Charged Particle Beam System App 20140001357 - Graupera; Anthony ; et al.	2014-01-02
Lamella creation method and device using fixed-angle beam and rotating sample stage App 20130328246 - Wells; Andrew B. ; et al.	2013-12-12
Multi-source Plasma Focused Ion Beam System App 20130309421 - Smith; Noel ; et al.	2013-11-21
Image-Enhancing Spotlight Mode for Digital Microscopy App 20130307960 - Bahm; Alan ; et al.	2013-11-21
Method and Apparatus for Actively Monitoring an Inductively-Coupled Plasma Ion Source using an Optical Spectrometer App 20130250293 - Utlaut; Mark W. ; et al.	2013-09-26
Charged Particle Beam System Aperture App 20130181140 - Parker; N. William ; et al.	2013-07-18
System for Attachment of an Electrode into an Inductively Coupled Plasma Source App 20130134855 - Kellogg; Sean ; et al.	2013-05-30
Multi-source plasma focused ion beam system Grant 8,405,054 - Smith , et al. March 26, 2	2013-03-26
Methods and Structures for Rapid Switching Between Different Process Gases in an Inductively-Coupled Plasma (ICP) Ion Source App 20130015765 - Graupera; Anthony ; et al.	2013-01-17
System and method for localization of large numbers of fluorescent markers in biological samples Grant 8,319,181 - Parker , et al. November 27, 2	2012-11-27
Combination laser and charged particle beam system Grant 8,314,410 - Straw , et al. November 20, 2	2012-11-20
Aberration-corrected Wien Exb Mass Filter With Removal Of Neutrals From The Beam App 20120261566 - Tuggle; David ; et al.	2012-10-18
Encapsulation of Electrodes in Solid Media for use in conjunction with Fluid High Voltage Isolation App 20120261587 - Kellogg; Sean ; et al.	2012-10-18
Aberration-corrected wien ExB mass filter with removal of neutrals from the Beam Grant 8,283,629 - Tuggle , et al. October 9, 2	2012-10-09
System and Method for Localization of Large Numbers of Fluorescent Markers in Biological Samples App 20120193530 - Parker; N. William ; et al.	2012-08-02
Encapsulation of Electrodes in Solid Media for use in conjunction with Fluid High Voltage Isolation App 20110272592 - Kellogg; Sean ; et al.	2011-11-10
Combination Laser and Charged Particle Beam System App 20110248164 - Straw; Marcus ; et al.	2011-10-13
Multi-source Plasma Focused Ion Beam System App 20090309018 - Smith; Noel ; et al.	2009-12-17
Particle detector suitable for detecting ions and electrons Grant 7,009,187 - Gerlach , et al. March 7, 2	2006-03-07
Angular aperture shaped beam system and method Grant 6,977,386 - Gerlach , et al. December 20, 2	2005-12-20
Shaped and low density focused ion beams Grant 6,949,756 - Gerlach , et al. September 27, 2	2005-09-27
Focused ion beam system with coaxial scanning electron microscope Grant 6,900,447 - Gerlach , et al. May 31, 2	2005-05-31
Particle detector suitable for detecting ions and electrons App 20040262531 - Gerlach, Robert L. ; et al.	2004-12-30
Multi-column FIB for nanofabrication applications Grant 6,797,969 - Gerlach , et al. September 28, 2	2004-09-28
Angular aperture shaped beam system and method App 20040140438 - Gerlach, Robert L. ; et al.	2004-07-22
Focused ion beam system with coaxial scanning electron microscope App 20040108458 - Gerlach, Robert L. ; et al.	2004-06-10
Through-the-lens neutralization for charged particle beam system Grant 6,683,320 - Gerlach , et al. January 27, 2	2004-01-27
Through-the-lens neutralization for charged particle beam system App 20020134949 - Gerlach, Robert L. ; et al.	2002-09-26
Shaped and low density focused ion beams App 20010045525 - Gerlach, Robert L. ; et al.	2001-11-29
Multi-column FIB for nanofabrication applications App 20010032939 - Gerlach, Robert L. ; et al.	2001-10-25
Through-the-lens-collection of secondary particles for a focused ion beam system App 20010032938 - Gerlach, Robert L. ; et al.	2001-10-25
Liquid metal ion source and alloy for ion emission of multiple ionic species Grant 4,670,685 - Clark, Jr. , et al. June 2, 1	1987-06-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.