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name:-0.064680099487305
name:-0.062863111495972
name:-0.0032222270965576
Ushiku; Yukihiro Patent Filings

Ushiku; Yukihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ushiku; Yukihiro.The latest application filed is for "process control system, process control method, and method of manufacturing electronic apparatus".

Company Profile
0.41.34
  • Ushiku; Yukihiro - Yokohama JP
  • Ushiku; Yukihiro - Yokohama-shi JP
  • Ushiku; Yukihiro - Kanagawa-ken JP
  • Ushiku; Yukihiro - Kanagawa JP
  • Ushiku; Yukihiro - Tsurumi-ku Yokohama-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Process control system, process control method, and method of manufacturing electronic apparatus
Grant 7,831,330 - Sugamoto , et al. November 9, 2
2010-11-09
Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator
Grant 7,702,413 - Ushiku , et al. April 20, 2
2010-04-20
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
Grant 7,700,381 - Arikado , et al. April 20, 2
2010-04-20
Process control system, process control method, and method of manufacturing electronic apparatus
App 20090276078 - Sugamoto; Junji ;   et al.
2009-11-05
Process control system, process control method, and method of manufacturing electronic apparatus
Grant 7,596,421 - Sugamoto , et al. September 29, 2
2009-09-29
Semiconductor device and method of manufacturing the same
Grant 7,588,973 - Ushiku September 15, 2
2009-09-15
Method of inspecting semiconductor wafer
Grant 7,531,462 - Tanzawa , et al. May 12, 2
2009-05-12
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
Grant 7,529,634 - Mitsutake , et al. May 5, 2
2009-05-05
Quality control system, quality control method, and method of lot-to-lot wafer processing
Grant 7,463,941 - Ogawa , et al. December 9, 2
2008-12-09
Method and apparatus for manufacturing semiconductor device, method and apparatus for controlling the same, and method and apparatus for simulating manufacturing process of semiconductor device
Grant 7,413,914 - Ushiku , et al. August 19, 2
2008-08-19
Semiconductor device and method of manufacturing the same
Grant 7,361,960 - Tsunashima , et al. April 22, 2
2008-04-22
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server
Grant 7,324,855 - Ushiku , et al. January 29, 2
2008-01-29
Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus
Grant 7,314,766 - Sugamoto , et al. January 1, 2
2008-01-01
Equipment for and method of detecting faults in semiconductor integrated circuits
Grant 7,222,026 - Matsushita , et al. May 22, 2
2007-05-22
System and method for monitoring manufacturing apparatuses
Grant 7,221,991 - Matsushita , et al. May 22, 2
2007-05-22
System and method for controlling manufacturing processes, and method for manufacturing a semiconductor device
Grant 7,188,049 - Tsuchiya , et al. March 6, 2
2007-03-06
Process control system, process control method, and method of manufacturing electronic apparatus
App 20060287754 - Sugamoto; Junji ;   et al.
2006-12-21
Method of inspecting semiconductor wafer
App 20060281281 - Tanzawa; Katsujiro ;   et al.
2006-12-14
Quality control system, quality control method, and method of lot-to-lot wafer processing
App 20060235560 - Ogawa; Akira ;   et al.
2006-10-19
Semiconductor manufacturing apparatus and semiconductor device manufacturing method
App 20060217830 - Saki; Kazuo ;   et al.
2006-09-28
Semiconductor manufacturing apparatus and semiconductor device manufacturing method
Grant 7,082,346 - Saki , et al. July 25, 2
2006-07-25
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
App 20060131696 - Arikado; Tsunetoshi ;   et al.
2006-06-22
Manufacturing apparatus and method for predicting life of a manufacturing apparatus which uses a rotary machine
Grant 7,065,469 - Samata , et al. June 20, 2
2006-06-20
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
Grant 7,057,259 - Arikado , et al. June 6, 2
2006-06-06
Method for determining a failure of a manufacturing condition, system for determining a failure of a manufacuring condition and method for manufacturing an industrial product
App 20060085165 - Ushiku; Yukihiro ;   et al.
2006-04-20
Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management server
App 20060064188 - Ushiku; Yukihiro ;   et al.
2006-03-23
Processing system and operating method of processing system
App 20050284575 - Hasebe, Kazuhide ;   et al.
2005-12-29
Vacuum pumping system and method for monitoring of the same
App 20050260081 - Tanaka, Masayuki ;   et al.
2005-11-24
System and method for controlling manufacturing processes, and method for manufacturing a semiconductor device
App 20050233601 - Tsuchiya, Norihiko ;   et al.
2005-10-20
Semiconductor device and method of manufacturing the same
App 20050233508 - Ushiku, Yukihiro
2005-10-20
Apparatus for predicting life of rotary machine and equipment using the same
Grant 6,944,572 - Ushiku , et al. September 13, 2
2005-09-13
System and method for controlling manufacturing apparatuses
App 20050194590 - Matsushita, Hiroshi ;   et al.
2005-09-08
Method for avoiding irregular shutoff of production equipment and system for avoiding irregular shutoff
Grant 6,937,963 - Ishii , et al. August 30, 2
2005-08-30
Semiconductor device and method of manufacturing the same
Grant 6,930,359 - Ushiku August 16, 2
2005-08-16
Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system
Grant 6,909,993 - Nakao , et al. June 21, 2
2005-06-21
System for predicting life of a rotary machine, method for predicting life of a manufacturing apparatus which uses a rotary machine and a manufacturing apparatus
Grant 6,898,551 - Samata , et al. May 24, 2
2005-05-24
Manufacturing apparatus and method for predicting life of rotary machine used in the same
App 20050107984 - Samata, Shuichi ;   et al.
2005-05-19
Semiconductor device manufacturing system and method for manufacturing semiconductor devices
App 20050095774 - Ushiku, Yukihiro ;   et al.
2005-05-05
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
App 20050097481 - Mitsutake, Kunihiro ;   et al.
2005-05-05
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
Grant 6,885,950 - Mitsutake , et al. April 26, 2
2005-04-26
Method for predicting life span of rotary machine used in manufacturing apparatus and life predicting system
Grant 6,885,972 - Samata , et al. April 26, 2
2005-04-26
Method for predicting life of rotary machine and determining repair timing of rotary machine
Grant 6,865,513 - Ushiku , et al. March 8, 2
2005-03-08
Semiconductor device and method of manufacturing the same
App 20040173851 - Ushiku, Yukihiro
2004-09-09
Apparatus for diagnosing failure in equipment using signals relating to the equipment
Grant 6,782,348 - Ushiku August 24, 2
2004-08-24
Apparatus for predicting life of rotary machine and equipment using the same
App 20040143418 - Ushiku, Yukihiro ;   et al.
2004-07-22
Method for diagnosing life of manufacturing equipment using rotary machine
Grant 6,766,275 - Samata , et al. July 20, 2
2004-07-20
Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatus
App 20040137752 - Sugamoto, Junji ;   et al.
2004-07-15
Semiconductor device and method of manufacturing the same
Grant 6,724,045 - Ushiku April 20, 2
2004-04-20
Manufacturing apparatus and method for predicting life of a manufacturing apparatus which uses a rotary machine
App 20040064277 - Samata, Shuichi ;   et al.
2004-04-01
System for predicting life of a rotary machine, method for predicting life of a manufacturing apparatus which uses a rotary machine and a manufacturing apparatus
App 20040064291 - Samata, Shuichi ;   et al.
2004-04-01
Manufacturing apparatus and method for predicting life of rotary machine used in the same
App 20040064212 - Samata, Shuichi ;   et al.
2004-04-01
Semiconductor manufacturing apparatus and semiconductor device manufacturing method
App 20040044419 - Saki, Kazuo ;   et al.
2004-03-04
Method for avoiding irregular shutoff of production equipment and system for avoiding irregular shutoff
App 20030158705 - Ishii, Ken ;   et al.
2003-08-21
Method for predicting life span of rotary machine used in manufacturing apparatus and life predicting system
App 20030153997 - Samata, Shuichi ;   et al.
2003-08-14
Method for diagnosing life of manufacturing equipment using rotary machine
App 20030154052 - Samata, Shuichi ;   et al.
2003-08-14
Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system
App 20030149547 - Nakao, Takashi ;   et al.
2003-08-07
Vacuum pumping system and method for monitoring of the same
App 20030041802 - Tanaka, Masayuki ;   et al.
2003-03-06
Equipment for and method of detecting faults in semiconductor integrated circuits
App 20030011376 - Matsushita, Hiroshi ;   et al.
2003-01-16
Apparatus for predicting life of rotary machine, equipment using the same, method for predicting life and determining repair timing of the same
App 20030009311 - Ushiku, Yukihiro ;   et al.
2003-01-09
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
App 20030003608 - Arikado, Tsunetoshi ;   et al.
2003-01-02
Apparatus for diagnosing failure in equipment using signals relating to the equipment
App 20020193891 - Ushiku, Yukihiro
2002-12-19
Method and apparatus for manufacturing semiconductor device, method and apparatus for controlling the same, and method and apparatus for simulating manufacturing process of semiconductor device
App 20020180449 - Ushiku, Yukihiro ;   et al.
2002-12-05
Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
App 20020053065 - Mitsutake, Kunihiro ;   et al.
2002-05-02
Semiconductor device having solid phase diffusion sources
Grant 5,898,203 - Yoshitomi , et al. April 27, 1
1999-04-27
Semiconductor device having a projecting element region
Grant 5,844,278 - Mizuno , et al. December 1, 1
1998-12-01
Semiconductor device and method of manufacturing the same
Grant 5,766,965 - Yoshitomi , et al. June 16, 1
1998-06-16
Semiconductor device and method of manufacturing the same
Grant 5,763,953 - IIjima , et al. June 9, 1
1998-06-09
Dielectrically isolated substrate and method for manufacturing the same
Grant 5,739,575 - Numano , et al. April 14, 1
1998-04-14
MOSFET with solid phase diffusion source
Grant 5,698,881 - Yoshitomi , et al. December 16, 1
1997-12-16
Semiconductor device and a method for manufacturing the same
Grant 5,675,176 - Ushiku , et al. October 7, 1
1997-10-07
Semiconductor device and method of manufacturing the same
Grant 5,434,440 - Yoshitomi , et al. July 18, 1
1995-07-18
Method of manufacturing insulated-gate type field effect transistor
Grant 5,185,279 - Ushiku February 9, 1
1993-02-09
Semiconductor integrated circuit with dummy patterns
Grant 5,032,890 - Ushiku , et al. July 16, 1
1991-07-16
Method of manufacturing insulated-gate type field effect transistor
Grant 5,028,552 - Ushiku July 2, 1
1991-07-02
Multilayer interconnection structure for semiconductor device
Grant 4,587,549 - Ushiku May 6, 1
1986-05-06

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