Ushiki; Takeo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ushiki; Takeo.The latest application filed is for "surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device".

Company Profile

0.18.15

Ushiki; Takeo - Tokyo JP
Ushiki; Takeo - Kanagawa JP
Ushiki; Takeo - Sendai JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface contamination analyzer for semiconductor wafers Grant 7,795,593 - Ushiki , et al. September 14, 2	2010-09-14
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Grant 7,700,380 - Ushiki , et al. April 20, 2	2010-04-20
Surface Contamination Analyzer For Semiconductor Wafers, Method Used Therein And Process For Fabricating Semiconductor Device App 20090039274 - USHIKI; Takeo ; et al.	2009-02-12
Semiconductor device tester Grant 7,385,195 - Yamada , et al. June 10, 2	2008-06-10
Production managing system of semiconductor device Grant 7,321,805 - Yamada , et al. January 22, 2	2008-01-22
Semiconductor device tester App 20060202119 - Yamada; Keizo ; et al.	2006-09-14
Film thickness measuring apparatus and a method for measuring a thickness of a film Grant 7,002,361 - Yamada , et al. February 21, 2	2006-02-21
Semiconductor device tester Grant 6,975,125 - Yamada , et al. December 13, 2	2005-12-13
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device App 20050230622 - Ushiki, Takeo ; et al.	2005-10-20
Semiconductor device tester Grant 6,946,857 - Yamada , et al. September 20, 2	2005-09-20
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Grant 6,943,043 - Ushiki , et al. September 13, 2	2005-09-13
Film Thickness Measuring Apparatus And A Method For Measuring A Thickness Of A Film App 20050116726 - Yamada, Keizo ; et al.	2005-06-02
Production managing system of semiconductor device App 20050106803 - Yamada, Keizo ; et al.	2005-05-19
Film thickness measuring apparatus and a method for measuring a thickness of a film Grant 6,850,079 - Yamada , et al. February 1, 2	2005-02-01
Production managing system of semiconductor device Grant 6,842,663 - Yamada , et al. January 11, 2	2005-01-11
Semiconductor manufacturing device Grant 6,837,936 - Ushiki , et al. January 4, 2	2005-01-04
Semiconductor device tester App 20040239347 - Yamada, Keizo ; et al.	2004-12-02
Semiconductor device tester App 20040207415 - Yamada, Keizo ; et al.	2004-10-21
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device App 20040206903 - Ushiki, Takeo ; et al.	2004-10-21
Production managing system of semiconductor device App 20040167656 - Yamada, Keizo ; et al.	2004-08-26
Semiconductor device tester which measures information related to a structure of a sample in a depth direction Grant 6,768,324 - Yamada , et al. July 27, 2	2004-07-27
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Grant 6,753,194 - Ushiki , et al. June 22, 2	2004-06-22
Production managing system of semiconductor device Grant 6,711,453 - Yamada , et al. March 23, 2	2004-03-23
Method and apparatus for measuring thickness of thin film Grant 6,683,308 - Itagaki , et al. January 27, 2	2004-01-27
Semiconductor device inspecting apparatus Grant 6,614,244 - Yamada , et al. September 2, 2	2003-09-02
Method and apparatus for measuring thickness of thin film App 20030132381 - Itagaki, Yosuke ; et al.	2003-07-17
Film thickness measuring apparatus and a method for measuring a thickness of a film App 20030132765 - Yamada, Keizo ; et al.	2003-07-17
Production managing system of semiconductor device App 20020123818 - Yamada, Keizo ; et al.	2002-09-05
Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device App 20020123161 - Ushiki, Takeo ; et al.	2002-09-05
Semiconductor manufacturing device App 20020118348 - Ushiki, Takeo ; et al.	2002-08-29
Semiconductor device inspecting apparatus App 20020070738 - Yamada, Keizo ; et al.	2002-06-13
Treating method and apparatus utilizing chemical reaction Grant 6,258,244 - Ohmi , et al. July 10, 2	2001-07-10
SOI bonding structure Grant 6,255,731 - Ohmi , et al. July 3, 2	2001-07-03

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