URANO; Takahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for URANO; Takahiro.The latest application filed is for "defect inspection method and defect inspection device".

Company Profile

7.12.16

URANO; Takahiro - Tokyo JP
URANO; Takahiro - Kanagawa JP
Urano; Takahiro - Ebina N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect Inspection Method and Defect Inspection Device App 20220301136 - HIROI; Takashi ; et al.	2022-09-22
Accelerator Pedal Device App 20220118849 - NAGASHIMA; Jun ; et al.	2022-04-21
Defect Inspection Apparatus and Defect Inspection Program App 20220084856 - HIROI; Takashi ; et al.	2022-03-17
Defect Inspection Device and Defect Inspection Method App 20210381989 - HIROI; Takashi ; et al.	2021-12-09
Inspection information generation device, inspection information generation method, and defect inspection device Grant 11,041,815 - Urano , et al. June 22, 2	2021-06-22
Defect inspection device and defect inspection method Grant 10,861,145 - Honda , et al. December 8, 2	2020-12-08
Flaw inspection device and flaw inspection method Grant 10,816,484 - Honda , et al. October 27, 2	2020-10-27
Flaw Inspection Device And Flaw Inspection Method App 20200057003 - Honda; Toshifumi ; et al.	2020-02-20
Flaw inspection device and flaw inspection method Grant 10,466,181 - Honda , et al. No	2019-11-05
Defect Inspection Device And Defect Inspection Method App 20190206047 - HONDA; Toshifumi ; et al.	2019-07-04
Inspection Information Generation Device, Inspection Information Generation Method, And Defect Inspection Device App 20190154593 - URANO; Takahiro ; et al.	2019-05-23
Flaw Inspection Device And Flaw Inspection Method App 20190094155 - HONDA; Toshifumi ; et al.	2019-03-28
Defect inspection method and defect inspection device Grant 9,865,046 - Urano , et al. January 9, 2	2018-01-09
Defect inspection device and defect inspection method Grant 9,778,206 - Honda , et al. October 3, 2	2017-10-03
Defect Inspection Device And Defect Inspection Method App 20150369752 - HONDA; Toshifumi ; et al.	2015-12-24
Defect Inspection Method And Defect Inspection Device App 20150356727 - URANO; Takahiro ; et al.	2015-12-10
Defect inspection device and defect inspection method Grant 9,075,026 - Urano , et al. July 7, 2	2015-07-07
Defect inspection device and method of inspecting defect Grant 8,908,172 - Urano , et al. December 9, 2	2014-12-09
Apparatus and method for inspecting defect Grant 8,737,718 - Sakai , et al. May 27, 2	2014-05-27
Defect Inspection Method And Defect Inspection Device App 20130294677 - Urano; Takahiro ; et al.	2013-11-07
Defect Inspection Method, Defect Inspection Apparatus, Program Product And Output Unit App 20130202188 - URANO; Takahiro ; et al.	2013-08-08
Defect Inspection Device And Method Of Inspecting Defect App 20120293795 - Urano; Takahiro ; et al.	2012-11-22
Defect Inspection Device And Defect Inspection Method App 20120229618 - Urano; Takahiro ; et al.	2012-09-13
Apparatus And Method For Inspecting Defect App 20120141012 - Sakai; Kaoru ; et al.	2012-06-07

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