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name:-0.011023998260498
name:-0.025446891784668
name:-0.0011370182037354
Ung; Rath Patent Filings

Ung; Rath

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ung; Rath.The latest application filed is for "test parallelism increase by tester controllable switching of chip select groups".

Company Profile
0.5.5
  • Ung; Rath - Apex NC
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Test mode for programming rate and precharge time for DRAM activate-precharge cycle
Grant 7,539,911 - Perry , et al. May 26, 2
2009-05-26
Random access memory including circuit to compress comparison results
Grant 7,457,177 - Perry , et al. November 25, 2
2008-11-25
Test parallelism increase by tester controllable switching of chip select groups
Grant 7,362,632 - Rehm , et al. April 22, 2
2008-04-22
Random access memory including first and second voltage sources
Grant 7,313,033 - Fuhrmann , et al. December 25, 2
2007-12-25
Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer
Grant 7,299,388 - Ung , et al. November 20, 2
2007-11-20
Test parallelism increase by tester controllable switching of chip select groups
App 20070165469 - Rehm; Norbert ;   et al.
2007-07-19
Random access memory including circuit to compress comparison results
App 20070140024 - Perry; Rob ;   et al.
2007-06-21
Random access memory including first and second voltage sources
App 20070070683 - Fuhrmann; Dirk ;   et al.
2007-03-29
Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer
App 20070011518 - Ung; Rath ;   et al.
2007-01-11
Test mode for programming rate and precharge time for DRAM activate-precharge cycle
App 20060282718 - Perry; Robert ;   et al.
2006-12-14

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