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Patent applications and USPTO patent grants for Uncovsky; Marek.The latest application filed is for "light guide assembly for an electron microscope".
Patent | Date |
---|---|
Light guide assembly for an electron microscope Grant 11,335,536 - Uncovsky , et al. May 17, 2 | 2022-05-17 |
Measurement and endpointing of sample thickness Grant 10,978,272 - Vystavel , et al. April 13, 2 | 2021-04-13 |
Light Guide Assembly For An Electron Microscope App 20210082659 - Uncovsky; Marek ;   et al. | 2021-03-18 |
Measurement And Endpointing Of Sample Thickness App 20200135427 - Vystavel; Tomas ;   et al. | 2020-04-30 |
Environmental cell for charged particle beam system Grant 9,679,741 - Novak , et al. June 13, 2 | 2017-06-13 |
Investigation Of High-temperature Specimens In A Charged Particle Microscope App 20170103868 - Novak; Libor ;   et al. | 2017-04-13 |
Detection method for use in charged-particle microscopy Grant 9,153,416 - Hlavenka , et al. October 6, 2 | 2015-10-06 |
Detection Method For Use In Charged-particle Microscopy App 20140374593 - Hlavenka; Petr ;   et al. | 2014-12-25 |
Detector for use in charged-particle microscopy Grant 8,735,849 - Hlavenka , et al. May 27, 2 | 2014-05-27 |
Detector for Use in Charged-Particle Microscopy App 20120205539 - Hlavenka; Petr ;   et al. | 2012-08-16 |
Environmental Cell for Charged Particle Beam System App 20120112062 - Novak; Libor ;   et al. | 2012-05-10 |
Multistage gas cascade amplifier Grant 7,791,020 - Uncovsky , et al. September 7, 2 | 2010-09-07 |
Multistage Gas Cascade Amplifier App 20090242758 - UNCOVSKY; MAREK ;   et al. | 2009-10-01 |
Particle detector suitable for detecting ions and electrons Grant 7,009,187 - Gerlach , et al. March 7, 2 | 2006-03-07 |
Particle detector suitable for detecting ions and electrons App 20040262531 - Gerlach, Robert L. ;   et al. | 2004-12-30 |
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