Umemura; Yoshiharu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Umemura; Yoshiharu.The latest application filed is for "probe and method of manufacturing same".
- Umemura; Yoshiharu - Kanagawa JP
- Umemura; Yoshiharu - Tokyo N/A JP
- Umemura; Yoshiharu - Fujisawa JP
| Patent | Date |
|---|---|
| Method of manufacturing probe having boards connected by magnets Grant 8,779,791 - Umemura , et al. July 15, 2 | 2014-07-15 |
| Probe, electronic device test apparatus, and method of producing the same Grant 8,598,902 - Umemura , et al. December 3, 2 | 2013-12-03 |
| Wafer tray and test apparatus Grant 8,513,962 - Kiyokawa , et al. August 20, 2 | 2013-08-20 |
| Probe wafer, probe device, and testing system Grant 8,427,187 - Komoto , et al. April 23, 2 | 2013-04-23 |
| Test system and probe apparatus Grant 8,410,807 - Umemura , et al. April 2, 2 | 2013-04-02 |
| Test wafer unit and test system Grant 8,289,040 - Komoto , et al. October 16, 2 | 2012-10-16 |
| Probe wafer, probe device, and testing system Grant 8,134,379 - Komoto , et al. March 13, 2 | 2012-03-13 |
| Probe And Method Of Manufacturing Same App 20120038382 - Umemura; Yoshiharu ; et al. | 2012-02-16 |
| Probe Wafer, Probe Device, And Testing System App 20110121848 - KOMOTO; Yoshio ; et al. | 2011-05-26 |
| Probe, Electronic Device Test Apparatus, And Method Of Producing The Same App 20110121847 - Umemura; Yoshiharu | 2011-05-26 |
| Probe Wafer, Probe Device, And Testing System App 20110109337 - KOMOTO; Yoshio ; et al. | 2011-05-12 |
| Test Wafer Unit And Test System App 20110095777 - KOMOTO; Yoshio ; et al. | 2011-04-28 |
| Test System And Probe Apparatus App 20110062979 - UMEMURA; Yoshiharu ; et al. | 2011-03-17 |
| Wafer Tray And Test Apparatus App 20110043237 - KIYOKAWA; Toshiyuki ; et al. | 2011-02-24 |
| Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus Grant 7,389,190 - Umemura , et al. June 17, 2 | 2008-06-17 |
| Temperature compensation circuit and testing apparatus Grant 7,342,407 - Kuwana , et al. March 11, 2 | 2008-03-11 |
| Temperature compensation circuit and testing apparatus App 20070176617 - Kuwana; Yuji ; et al. | 2007-08-02 |
| Sampling circuit Grant 7,208,982 - Yamakawa , et al. April 24, 2 | 2007-04-24 |
| Calibration comparator circuit App 20060267637 - Umemura; Yoshiharu ; et al. | 2006-11-30 |
| Sampling circuit App 20060097898 - Yamakawa; Masahiro ; et al. | 2006-05-11 |
| Comparator including a differential transistor pair and a diode arrangement Grant 6,774,680 - Imagawa , et al. August 10, 2 | 2004-08-10 |
| Comparator App 20030222681 - Imagawa, Kengo ; et al. | 2003-12-04 |
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