loadpatents
name:-0.017690896987915
name:-0.022861003875732
name:-0.0017011165618896
Umemoto; Takeshi Patent Filings

Umemoto; Takeshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Umemoto; Takeshi.The latest application filed is for "analyzing apparatus and analyzing method".

Company Profile
1.21.15
  • Umemoto; Takeshi - Tokyo JP
  • Umemoto; Takeshi - Tokyo-to JP
  • Umemoto; Takeshi - Fukuoka JP
  • Umemoto; Takeshi - Osaka JP
  • Umemoto; Takeshi - Osaka-shi JP
  • Umemoto; Takeshi - Chiba JP
  • Umemoto; Takeshi - Fukuyama JP
  • UMEMOTO; Takeshi - Chiba-shi JP
  • Umemoto; Takeshi - Hiroshima JP
  • Umemoto, Takeshi - Fukuyama-shi JP
  • Umemoto; Takeshi - Yokohama JA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Analyzing Apparatus and Analyzing Method
App 20190064091 - Umemoto; Takeshi ;   et al.
2019-02-28
Four wheeled vehicle
Grant D805,000 - Umemoto December 12, 2
2017-12-12
Method for digital communication, radio communication system, and radio communication apparatus
Grant 9,572,082 - Wen , et al. February 14, 2
2017-02-14
All-terrain vehicle
Grant D774,957 - Umemoto December 27, 2
2016-12-27
Four wheeled vehicle
Grant D761,698 - Umemoto July 19, 2
2016-07-19
Method For Digital Communication, Radio Communication System, And Radio Communication Apparatus
App 20150264628 - WEN; Yun ;   et al.
2015-09-17
Access apparatus and available storage space calculation method
Grant 9,015,444 - Maeda , et al. April 21, 2
2015-04-21
Solar Cell Module Having Laminated Glass Structure
App 20140283900 - Umemoto; Takeshi ;   et al.
2014-09-25
Access Apparatus And Available Storage Space Calculation Method
App 20120131301 - Maeda; Takuji ;   et al.
2012-05-24
AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
Grant 8,028,567 - Kobayashi , et al. October 4, 2
2011-10-04
Sample manipulating apparatus
Grant 7,926,328 - Yasutake , et al. April 19, 2
2011-04-19
Recording Device And Method For Activating The Same
App 20110083007 - Mori; Tsutomu ;   et al.
2011-04-07
Scanning probe microscope and scanning method
Grant 7,874,016 - Umemoto , et al. January 18, 2
2011-01-18
Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis
Grant 7,873,432 - Ohminami , et al. January 18, 2
2011-01-18
Sample operation apparatus
Grant 7,866,205 - Yasutake , et al. January 11, 2
2011-01-11
Sample operation apparatus
Grant 7,770,474 - Yasutake , et al. August 10, 2
2010-08-10
Semiconductor device, and method and apparatus for inspecting appearance thereof
Grant 7,515,258 - Ohminami , et al. April 7, 2
2009-04-07
AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope
App 20090000365 - KOBAYASHI; Tatsuya ;   et al.
2009-01-01
Sample Manipulating Apparatus
App 20080314131 - Yasutake; Masatoshi ;   et al.
2008-12-25
Scanning Probe Microscope and Scanning Method
App 20080156988 - Umemoto; Takeshi ;   et al.
2008-07-03
Sample Operation Apparatus
App 20080105043 - Yasutake; Masatoshi ;   et al.
2008-05-08
Sample Operation Apparatus
App 20080105044 - Yasutake; Masatoshi ;   et al.
2008-05-08
Semiconductor device, and method and apparatus for inspecting appearance thereof
App 20070132103 - Ohminami; Nobuyuki ;   et al.
2007-06-14
Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis
App 20060203230 - Ohminami; Nobuyuki ;   et al.
2006-09-14
Method of manufacturing semiconductor device
Grant 6,848,454 - Hirohama , et al. February 1, 2
2005-02-01
Semiconductor device with multi-layer interlayer dielectric film
Grant 6,765,283 - Umemoto July 20, 2
2004-07-20
Semiconductor device and method for fabricating the same
App 20030020175 - Umemoto, Takeshi
2003-01-30
Method of manufacturing semiconductor device
App 20020098706 - Hirohama, Kazuhiro ;   et al.
2002-07-25
Process for manufacturing semiconductor device
App 20010049188 - Umemoto, Takeshi
2001-12-06
Scanning probe microscope
Grant 6,291,822 - Umemoto , et al. September 18, 2
2001-09-18
Plastic-encapsulated semiconductor device and fabrication method thereof
Grant 6,175,150 - Ichikawa , et al. January 16, 2
2001-01-16
Semiconductor device with radiation plate for high radiation character and method of manufacturing the same
Grant 6,150,715 - Ichikawa , et al. November 21, 2
2000-11-21
Semiconductor device having lead terminals bent in J-shape
Grant 6,104,086 - Ichikawa , et al. August 15, 2
2000-08-15
Scanning type near field interatomic force microscope
Grant 5,939,623 - Muramatsu , et al. August 17, 1
1999-08-17
Horizontal packed column consisting of multiple chambers with fluid distributors
Grant 3,948,775 - Otani , et al. April 6, 1
1976-04-06

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