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name:-0.0096719264984131
name:-0.0052731037139893
name:-0.0023908615112305
Umehara; Yasutoshi Patent Filings

Umehara; Yasutoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Umehara; Yasutoshi.The latest application filed is for "film thickness measuring system and film thickness measuring method".

Company Profile
1.5.7
  • Umehara; Yasutoshi - Tokyo JP
  • Umehara; Yasutoshi - Sapporo N/A JP
  • Umehara; Yasutoshi - Hokkaido JP
  • Umehara; Yasutoshi - Sapporo-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Film thickness measurement device and correction method
Grant 11,226,191 - Umehara January 18, 2
2022-01-18
Film Thickness Measuring System And Film Thickness Measuring Method
App 20210293531 - UMEHARA; Yasutoshi
2021-09-23
Film Thickness Measurement Device And Correction Method
App 20210270597 - UMEHARA; Yasutoshi
2021-09-02
Maintenance Control Method Of Controlling Maintenance Of Processing Device And Control Device
App 20200126829 - MATSUI; Hidefumi ;   et al.
2020-04-23
Process monitoring device and process monitoring method in semiconductor manufacturing apparatus and semiconductor manufacturing apparatus
Grant 8,989,477 - Umehara , et al. March 24, 2
2015-03-24
X-ray Inspection Method And X-ray Inspection Device
App 20150055754 - UMEHARA; Yasutoshi
2015-02-26
Abnormality detection system, abnormality detection method, recording medium, and substrate processing apparatus
Grant 8,751,196 - Moriya , et al. June 10, 2
2014-06-10
Process Monitoring Device And Process Monitoring Method In Semiconductor Manufacturing Apparatus And Semiconductor Manufacturing Apparatus
App 20130236088 - UMEHARA; Yasutoshi ;   et al.
2013-09-12
Abnormality Detection System, Abnormality Detection Method, And Recording Medium
App 20120109582 - Moriya; Tsuyoshi ;   et al.
2012-05-03
Information Processing Device, Information Processing Method And Program
App 20100153065 - KAWAMURA; Kazuhiro ;   et al.
2010-06-17
Signal measuring apparatus and signal measuring method
Grant 5,550,479 - Wakana , et al. August 27, 1
1996-08-27

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