loadpatents
name:-0.011366844177246
name:-0.010191917419434
name:-0.0025389194488525
Ukraintsev; Vladimir A. Patent Filings

Ukraintsev; Vladimir A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ukraintsev; Vladimir A..The latest application filed is for "probe-based data collection system with adaptive mode of probing controlled by local sample properties".

Company Profile
2.10.10
  • Ukraintsev; Vladimir A. - Allen TX
  • Ukraintsev; Vladimir A - Allen TX US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Optical nanoprobing of integrated circuits
Grant 10,175,295 - Ukraintsev , et al. J
2019-01-08
Probe-based data collection system with adaptive mode of probing controlled by local sample properties
Grant 9,891,280 - Ukraintsev , et al. February 13, 2
2018-02-13
Probe-based Data Collection System With Adaptive Mode Of Probing Controlled By Local Sample Properties
App 20170082685 - Ukraintsev; Vladimir A. ;   et al.
2017-03-23
Optical Nanoprobing Of Integrated Circuits
App 20160377675 - Ukraintsev; Vladimir A. ;   et al.
2016-12-29
System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
Grant 9,506,947 - Ukraintsev , et al. November 29, 2
2016-11-29
Characterizing dimensions of structures via scanning probe microscopy
Grant 9,347,897 - Rogers , et al. May 24, 2
2016-05-24
System And Method For Non-contact Microscopy For Three-dimensional Pre-characterization Of A Sample For Fast And Non-destructive On Sample Navigation During Nanoprobing
App 20150301078 - Ukraintsev; Vladimir A. ;   et al.
2015-10-22
Probe-based Data Collection System With Adaptive Mode Of Probing
App 20150168444 - Ukraintsev; Vladimir A. ;   et al.
2015-06-18
Probe-based data collection system with adaptive mode of probing
Grant 9,057,740 - Ukraintsev , et al. June 16, 2
2015-06-16
Probe-based Data Collection System With Adaptive Mode Of Probing Controlled By Local Sample Properties
App 20140380531 - Ukraintsev; Vladimir A. ;   et al.
2014-12-25
System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
Grant 8,895,923 - Ukraintsev , et al. November 25, 2
2014-11-25
System And Method For Non-contact Microscopy For Three-dimensional Pre-characterization Of A Sample For Fast And Non-destructive On Sample Navigation During Nanoprobing
App 20140143912 - Ukraintsev; Vladimir A. ;   et al.
2014-05-22
Method for calibrating an inspection tool
Grant 8,305,097 - Ukraintsev November 6, 2
2012-11-06
Characterizing Dimensions of Structures Via Scanning Probe Microscopy
App 20120137396 - Rogers; Duncan M. ;   et al.
2012-05-31
Method For Calibrating An Inspection Tool
App 20090061543 - Ukraintsev; Vladimir A.
2009-03-05
Characterizing dimensions of structures via scanning probe microscopy
Grant 7,381,950 - Rogers , et al. June 3, 2
2008-06-03
Characterizing dimensions of structures via scanning probe microscopy
App 20060071164 - Rogers; Duncan M. ;   et al.
2006-04-06
Method for fabricating a multi-level integrated circuit having scatterometry test structures stacked over same footprint area
Grant 6,967,349 - Bonifield , et al. November 22, 2
2005-11-22
Scatterometry test structures stacked over same footprint area
App 20040058460 - Bonifield, Thomas D. ;   et al.
2004-03-25

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