Uetani; Hironori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Uetani; Hironori.The latest application filed is for "data processing system, method and program product of creating program information, and program information display system".

Company Profile

0.4.4

Uetani; Hironori - Kawasaki JP
UETANI; Hironori - Kawasaki-shi JP
Uetani; Hironori - Kanagawa-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Data processing system, method and program product of creating program information, and program information display system Grant 9,285,949 - Kuroda , et al. March 15, 2	2016-03-15
Data Processing System, Method And Program Product Of Creating Program Information, And Program Information Display System App 20150026702 - KURODA; Akira ; et al.	2015-01-22
Apparatus and program for designing system LSI, and method for verifying integrity of the program for designing system LSI Grant 7,062,400 - Uetani June 13, 2	2006-06-13
Apparatus and program for designing system LSI, and method for verifying integrity of the program for designing system LSI App 20050120314 - Uetani, Hironori	2005-06-02
Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program Grant 6,845,335 - Kohno , et al. January 18, 2	2005-01-18
Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program App 20030195715 - Kohno, Kazuyoshi ; et al.	2003-10-16
Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program Grant 6,611,779 - Kohno , et al. August 26, 2	2003-08-26
Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program App 20010007970 - Kohno, Kazuyoshi ; et al.	2001-07-12

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