loadpatents
Patent applications and USPTO patent grants for Udo; Shinji.The latest application filed is for "semiconductor memory device and defect remedying method thereof".
Patent | Date |
---|---|
Semiconductor memory device and defect remedying method thereof Grant 7,499,340 - Kajigaya , et al. March 3, 2 | 2009-03-03 |
Semiconductor memory device and defect remedying method thereof App 20080205111 - Kajigaya; Kazuhiko ;   et al. | 2008-08-28 |
Semiconductor memory device and defect remedying method thereof Grant 7,345,929 - Kajigaya , et al. March 18, 2 | 2008-03-18 |
Semiconductor memory device and defect remedying method thereof App 20070242535 - Kajigaya; Kazuhiko ;   et al. | 2007-10-18 |
Semiconductor memory device and defect remedying method thereof Grant 7,203,101 - Kajigaya , et al. April 10, 2 | 2007-04-10 |
Semiconductor memory device and defect remedying method thereof App 20060120125 - Kajigaya; Kazuhiko ;   et al. | 2006-06-08 |
Semiconductor memory device and defect remedying method thereof Grant 7,016,236 - Kajigaya , et al. March 21, 2 | 2006-03-21 |
Semiconductor memory device and defect remedying method thereof App 20050179058 - Kajigaya, Kazuhiko ;   et al. | 2005-08-18 |
Semiconductor memory device and defect remedying method thereof Grant 6,898,130 - Kajigaya , et al. May 24, 2 | 2005-05-24 |
Nonvolatile memory device Grant 6,829,178 - Koyama , et al. December 7, 2 | 2004-12-07 |
Semiconductor memory device and defect remedying method thereof App 20040240259 - Kajigaya, Kazuhiko ;   et al. | 2004-12-02 |
Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit Grant 6,657,901 - Kajigaya , et al. December 2, 2 | 2003-12-02 |
Nonvolatile memory device App 20030107918 - Koyama, Hiyori ;   et al. | 2003-06-12 |
Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit App 20030031058 - Kajigaya, Kazuhiko ;   et al. | 2003-02-13 |
Semiconductor memory device and defect remedying method thereof App 20020054514 - Kajigaya, Kazuhiko ;   et al. | 2002-05-09 |
Semiconductor memory device and defect remedying method thereof Grant 6,160,744 - Kajigaya , et al. December 12, 2 | 2000-12-12 |
Semiconductor memory device and defect remedying method thereof Grant 6,049,500 - Kajigaya , et al. April 11, 2 | 2000-04-11 |
Semiconductor memory device and defect remedying method thereof Grant 5,602,771 - Kajigaya , et al. February 11, 1 | 1997-02-11 |
Semiconductor memory device and defect remedying method thereof Grant 5,579,256 - Kajigaya , et al. November 26, 1 | 1996-11-26 |
Semiconductor integrated circuit device Grant 5,440,521 - Tsunozaki , et al. August 8, 1 | 1995-08-08 |
Semiconductor integrated circuit device with internal voltage drop circuits Grant 5,335,203 - Ishii , et al. August 2, 1 | 1994-08-02 |
Semiconductor memory Grant 5,018,101 - Kajigaya , et al. May 21, 1 | 1991-05-21 |
Semiconductor memory Grant 4,956,811 - Kajigaya , et al. September 11, 1 | 1990-09-11 |
Method of manufacture of a semiconductor device Grant 4,628,590 - Udo , et al. December 16, 1 | 1986-12-16 |
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