Tyminski; Jacek K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tyminski; Jacek K..The latest application filed is for "pattern-edge placement predictor and monitor for lithographic exposure tool".

Company Profile

1.8.6

Tyminski; Jacek K. - Mountain View CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern-edge placement predictor and monitor for lithographic exposure tool Grant 10,488,763 - Tyminski Nov	2019-11-26
Pattern-edge Placement Predictor And Monitor For Lithographic Exposure Tool App 20190278189 - Tyminski; Jacek K.	2019-09-12
Pattern-edge placement predictor and monitor for lithographic exposure tool Grant 10,345,715 - Tyminski July 9, 2	2019-07-09
Pattern-edge Placement Predictor And Monitor For Lithographic Exposure Tool App 20180299795 - Tyminski; Jacek K.	2018-10-18
Tuning of optical projection system to optimize image-edge placement Grant 10,018,922 - Tyminski July 10, 2	2018-07-10
Predicting pattern critical dimensions in a lithographic exposure process Grant 9,529,253 - Tyminski , et al. December 27, 2	2016-12-27
Tuning Of Optical Projection System To Optimize Image-edge Placement App 20160202619 - Tyminski; Jacek K.	2016-07-14
In-situ Scanner Exposure Monitor App 20130339910 - TYMINSKI; Jacek K. ; et al.	2013-12-19
Predicting pattern critical dimensions in a lithographic exposure process Grant 8,572,518 - Tyminski , et al. October 29, 2	2013-10-29
In-situ Scanner Exposure Monitor App 20120331427 - TYMINSKI; Jacek K. ; et al.	2012-12-27
Enhanced illuminator for use in photolithographic systems Grant RE41,681 - Tyminski September 14, 2	2010-09-14
Enhanced illuminator for use in photolithographic systems Grant 6,842,223 - Tyminski January 11, 2	2005-01-11
Enhanced illuminator for use in photolithographic systems App 20040201831 - Tyminski, Jacek K.	2004-10-14

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