| Patent | Date |
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Monitoring system and method for verifying measurements in pattened structures
App 20220163320 - Brill; Boaz ; et al. | 2022-05-26 |
Apparatus and method for electrical test prediction
Grant 11,335,612 - Turovets May 17, 2 | 2022-05-17 |
Test Structure Design For Metrology Measurements In Patterned Samples
App 20220099596 - BARAK; GILAD ; et al. | 2022-03-31 |
Test structure design for metrology measurements in patterned samples
Grant 11,143,601 - Barak , et al. October 12, 2 | 2021-10-12 |
Method and system for processing patterned structures
Grant 10,978,321 - Turovets April 13, 2 | 2021-04-13 |
Test Structure Design For Metrology Measurements In Patterned Samples
App 20200057005 - BARAK; GILAD ; et al. | 2020-02-20 |
An Apparatus And Method For Electrical Test Prediction
App 20200006165 - TUROVETS; IGOR | 2020-01-02 |
Monitoring System And Method For Verifying Measurements In Pattened Structures
App 20190339056 - BRILL; BOAZ ; et al. | 2019-11-07 |
Monitoring system and method for verifying measurements in patterned structures
Grant 10,295,329 - Brill , et al. | 2019-05-21 |
Surface planarization system and method
Grant 10,226,852 - Turovets | 2019-03-12 |
Test structure for use in metrology measurements of patterns
Grant 10,216,098 - Cohen , et al. Feb | 2019-02-26 |
Optical metrology for in-situ measurements
Grant 10,197,506 - Turovets , et al. Fe | 2019-02-05 |
Method And System For Processing Patterned Structures
App 20190027386 - TUROVETS; Igor | 2019-01-24 |
Test structures and metrology technique utilizing the test structures for measuring in patterned structures
Grant 10,066,936 - Turovets September 4, 2 | 2018-09-04 |
Optical Metrology For In-situ Measurements
App 20180195975 - TUROVETS; Igor ; et al. | 2018-07-12 |
Optical metrology for in-situ measurements
Grant 9,915,624 - Turovets , et al. March 13, 2 | 2018-03-13 |
Surface Planarization System And Method
App 20180029189 - TUROVETS; Igor | 2018-02-01 |
Test Structure For Use In Metrology Measurements Of Patterns
App 20170363970 - COHEN; Oded ; et al. | 2017-12-21 |
Optical Metrology For In-situ Measurements
App 20170167987 - TUROVETS; Igor ; et al. | 2017-06-15 |
Test Structure Design For Metrology Measurements In Patterned Samples
App 20170146465 - BARAK; Gilad ; et al. | 2017-05-25 |
Test Structures And Metrology Technique Utilizing The Test Structures For Measuring In Patterned Structures
App 20170023357 - TUROVETS; Igor | 2017-01-26 |
Optical metrology for in-situ measurements
Grant 9,528,946 - Turovets , et al. December 27, 2 | 2016-12-27 |
Surface Planarization System And Method
App 20160318148 - TUROVETS; Igor | 2016-11-03 |
Optical Metrology For In-situ Measurements
App 20150226680 - Turovets; Igor ; et al. | 2015-08-13 |
Monitoring system and method for verifying measurements in patterned structures
App 20140195194 - Brill; Boaz ; et al. | 2014-07-10 |
Method and device for electro microsurgery in a physiological liquid environment
Grant 6,620,160 - Lewis , et al. September 16, 2 | 2003-09-16 |
Method and device for electro microsurgery in a physiological liquid environment
App 20020062126 - Lewis, Aaron ; et al. | 2002-05-23 |
Method and a device for electro microsurgery in a physiological liquid environment
Grant 6,352,535 - Lewis , et al. March 5, 2 | 2002-03-05 |
Method and apparatus for concentrating laser beams
Grant 6,039,726 - Lewis , et al. March 21, 2 | 2000-03-21 |
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