Turnquist; James Alan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Turnquist; James Alan.The latest application filed is for "event based ic test system".

Company Profile

0.8.3

Turnquist; James Alan - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Event based IC test system Grant 7,089,135 - Rajsuman , et al. August 8, 2	2006-08-08
Event based semiconductor test system Grant 6,678,643 - Turnquist , et al. January 13, 2	2004-01-13
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory Grant 6,668,331 - Gomes , et al. December 23, 2	2003-12-23
Event based IC test system App 20030217345 - Rajsuman, Rochit ; et al.	2003-11-20
Semiconductor test system storing pin calibration data in non-volatile memory App 20030110427 - Rajsuman, Rochit ; et al.	2003-06-12
Event based test system storing pin calibration data in non-volatile memory Grant 6,567,941 - Turnquist , et al. May 20, 2	2003-05-20
Semiconductor test system supporting multiple virtual logic testers Grant 6,557,128 - Turnquist April 29, 2	2003-04-29
Event based semiconductor test system Grant 6,532,561 - Turnquist , et al. March 11, 2	2003-03-11
Semiconductor test system with time critical sequence generation using general purpose operating system App 20020157053 - Chen, Leon Lee ; et al.	2002-10-24
Multiple end of test signal for event based test system Grant 6,404,218 - Le , et al. June 11, 2	2002-06-11
Pattern data compression and decompression for semiconductor test system Grant 5,883,906 - Turnquist , et al. March 16, 1	1999-03-16

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