TURNER; Paul Jonathan
Patent Applications and Registrations
Patent applications and USPTO patent grants for TURNER; Paul Jonathan.The latest application filed is for "metrology method and apparatus, computer program and lithographic system".
- TURNER; Paul Jonathan - Veldhoven NL
- Turner; Paul Jonathan - Boise ID
| Patent | Date |
|---|---|
| Metrology Method And Apparatus, Computer Program And Lithographic System App 20220155694 - TURNER; Paul Jonathan ; et al. | 2022-05-19 |
| Method of determining a parameter of a pattern transfer process, device manufacturing method Grant 10,955,744 - Van Witteveen , et al. March 23, 2 | 2021-03-23 |
| Method Of Determining A Parameter Of A Pattern Transfer Process, Device Manufacturing Method App 20190064653 - Van Witteveen; Koen ; et al. | 2019-02-28 |
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