TSUNOKUNI; Kazuyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for TSUNOKUNI; Kazuyuki.The latest application filed is for "secondary battery".
Company Profile
9.19.27
- TSUNOKUNI; Kazuyuki - Musashino-shi Tokyo
- Tsunokuni; Kazuyuki - Aomori JP
- TSUNOKUNI; Kazuyuki - Tokyo JP
- Tsunokuni; Kazuyuki - Musashino JP
- Tsunokuni; Kazuyuki - Kanagawa N/A JP
- Tsunokuni; Kazuyuki - Iharaki JP
- TSUNOKUNI; Kazuyuki - Iharat JP
- Tsunokuni; Kazuyuki - Ibaraki JP
- Tsunokuni; Kazuyuki - Akiruno JP
- Tsunokuni, Kazuyuki - Kodaira JP
- Tsunokuni; Kazuyuki - Koganei JP
Patent Activity
| Patent | Date |
|---|---|
| Secondary Battery App 20220123358 - TSUNOKUNI; Kazuyuki ; et al. | 2022-04-21 |
| Secondary battery Grant 11,245,113 - Tonokawa , et al. February 8, 2 | 2022-02-08 |
| Secondary Battery App 20210351412 - HASEGAWA; Daisuke ; et al. | 2021-11-11 |
| Power Storage Device App 20210193924 - KUDOH; Takuo ; et al. | 2021-06-24 |
| Method For Manufacturing Secondary Battery App 20210091400 - TSUNOKUNI; Kazuyuki ; et al. | 2021-03-25 |
| Secondary Battery App 20200373575 - TSUNOKUNI; Kazuyuki ; et al. | 2020-11-26 |
| Intermediate structure unit for secondary cell and method for manufacturing secondary cell Grant 10,705,151 - Sato , et al. | 2020-07-07 |
| Secondary battery mounted chip manufacturing method Grant 10,686,210 - Tsunokuni , et al. | 2020-06-16 |
| Electricity Storage Device And Method For Manufacturing Solid Electrolyte Layer App 20200006009 - TONOKAWA; Takashi ; et al. | 2020-01-02 |
| Secondary Battery App 20200006764 - SAITO; Tomokazu ; et al. | 2020-01-02 |
| Electricity Storage Device App 20200006763 - TONOKAWA; Takashi ; et al. | 2020-01-02 |
| Method For Manufacturing Secondary Battery App 20190273278 - TSUNOKUNI; Kazuyuki ; et al. | 2019-09-05 |
| Secondary Battery App 20190190024 - TONOKAWA; Takashi ; et al. | 2019-06-20 |
| Secondary battery-mounted circuit chip and manufacturing method thereof Grant 10,090,507 - Tsunokuni , et al. October 2, 2 | 2018-10-02 |
| Secondary Battery Mounted Chip Manufacturing Method App 20180226674 - TSUNOKUNI; Kazuyuki ; et al. | 2018-08-09 |
| Intermediate Structure Unit For Secondary Cell And Method For Manufacturing Secondary Cell App 20180210033 - SATO; Yuki ; et al. | 2018-07-26 |
| Charging/discharging device Grant 9,735,594 - Dewa , et al. August 15, 2 | 2017-08-15 |
| Testing Device And Testing Method For Sheet-shaped Cell App 20170131361 - SAITO; Tomokazu ; et al. | 2017-05-11 |
| Secondary Battery-mounted Circuit Chip And Manufacturing Method Thereof App 20160181588 - TSUNOKUNI; Kazuyuki ; et al. | 2016-06-23 |
| Charging/discharging Device App 20150188337 - Dewa; Harutada ; et al. | 2015-07-02 |
| Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor device Grant 8,612,811 - Matsumoto , et al. December 17, 2 | 2013-12-17 |
| Method of manufacturing a semiconductor integrated circuit device Grant 8,093,723 - Funakoshi , et al. January 10, 2 | 2012-01-10 |
| Method Of Manufacturing A Semiconductor Integrated Circuit Device App 20110204486 - FUNAKOSHI; Takako ; et al. | 2011-08-25 |
| Defective-ratio Predicting Method, Defective-ratio Predicting Program, Managing Method For Semiconductor Manufacturing Apparatus, And Manufacturing Method For Semiconductor Device App 20110172806 - Matsumoto; Chizu ; et al. | 2011-07-14 |
| Method of manufacturing a semiconductor integrated circuit device Grant 7,977,238 - Funakoshi , et al. July 12, 2 | 2011-07-12 |
| Semiconductor integrated circuit device Grant 7,786,585 - Funakoshi , et al. August 31, 2 | 2010-08-31 |
| Method Of Manufacturing A Semiconductor Integrated Circuit Device App 20100203724 - FUNAKOSHI; Takako ; et al. | 2010-08-12 |
| Semiconductor Integrated Circuit Device App 20080303158 - Funakoshi; Takako ; et al. | 2008-12-11 |
| Semiconductor integrated circuit device Grant 7,411,301 - Funakoshi , et al. August 12, 2 | 2008-08-12 |
| Semiconductor integrated circuit device Grant 7,023,091 - Funakoshi , et al. April 4, 2 | 2006-04-04 |
| Semiconductor integrated circuit device App 20060027928 - Funakoshi; Takako ; et al. | 2006-02-09 |
| Method for test conditions Grant 6,895,346 - Hamamura , et al. May 17, 2 | 2005-05-17 |
| Photomask for test wafers Grant 6,841,405 - Hamamura , et al. January 11, 2 | 2005-01-11 |
| System for testing electronic devices Grant 6,780,660 - Hamamura , et al. August 24, 2 | 2004-08-24 |
| Method of testing electronic devices Grant 6,770,496 - Hamamura , et al. August 3, 2 | 2004-08-03 |
| Method of testing electronic devices indicating short-circuit Grant 6,771,077 - Hamamura , et al. August 3, 2 | 2004-08-03 |
| Ion current density measuring method and instrument, and semiconductor device manufacturing method App 20040092044 - Mise, Nobuyuki ; et al. | 2004-05-13 |
| Semiconductor integrated circuit device App 20040065961 - Funakoshi, Takako ; et al. | 2004-04-08 |
| Ion current density measuring method and instrument, and semiconductor device manufacturing method Grant 6,656,752 - Mise , et al. December 2, 2 | 2003-12-02 |
| Method of testing electronic devices App 20030197523 - Hamamura, Yuichi ; et al. | 2003-10-23 |
| Photomask for test wafers App 20030197522 - Hamamura, Yuichi ; et al. | 2003-10-23 |
| Method for test conditions App 20030199110 - Hamamura, Yuichi ; et al. | 2003-10-23 |
| System for testing electronic devices App 20030199111 - Hamamura, Yuichi ; et al. | 2003-10-23 |
| Method of manufacturing electronic devices App 20030199107 - Hamamura, Yuichi ; et al. | 2003-10-23 |
| Process for fabricating a semiconductor integrated circuit device having the multi-layered fin structure Grant 5,661,061 - Usuami , et al. August 26, 1 | 1997-08-26 |
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