Tsuneta; Ruriko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsuneta; Ruriko.The latest application filed is for "method for estimating shape before shrink and cd-sem apparatus".

Company Profile

0.21.17

Tsuneta; Ruriko - Tokyo JP
Tsuneta; Ruriko - Fuchu N/A JP
Tsuneta; Ruriko - Fucha JP
Tsuneta; Ruriko - Kokubunji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for estimating shape before shrink and CD-SEM apparatus Grant 9,830,524 - Sekiguchi , et al. November 28, 2	2017-11-28
Electric charged particle beam microscope and electric charged particle beam microscopy Grant 8,993,961 - Tsuneta , et al. March 31, 2	2015-03-31
Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy Grant 8,963,102 - Tsuneta , et al. February 24, 2	2015-02-24
Method For Estimating Shape Before Shrink And Cd-sem Apparatus App 20150036914 - Sekiguchi; Tomoko ; et al.	2015-02-05
Charged Particle Beam Microscope, Sample Holder For Charged Particle Beam Microscope, And Charged Particle Beam Microscopy App 20140353500 - Tsuneta; Ruriko ; et al.	2014-12-04
Specified position identifying method and specified position measuring apparatus Grant 8,442,300 - Tsuneta , et al. May 14, 2	2013-05-14
Multi-part specimen holder with conductive patterns Grant 8,334,519 - Ono , et al. December 18, 2	2012-12-18
Charged Particle Beam Microscope And Method Of Measurement Employing Same App 20120287258 - Tsuneta; Ruriko ; et al.	2012-11-15
Charged Particle Beam Microscope And Measuring Method Using Same App 20120104253 - Tsuneta; Ruriko ; et al.	2012-05-03
Electric charged particle beam microscope and microscopy Grant 7,863,564 - Tsuneta , et al. January 4, 2	2011-01-04
Electric charged particle beam microscopy and electric charged particle beam microscope Grant 7,633,064 - Tsuneta , et al. December 15, 2	2009-12-15
Electric Charged Particle Beam Microscope And Microscopy App 20090127474 - TSUNETA; Ruriko ; et al.	2009-05-21
Electron microscope App 20080283748 - Matsumoto; Takao ; et al.	2008-11-20
Scanning transmission electron microscope and scanning transmission electron microscopy Grant 7,372,029 - Tsuneta , et al. May 13, 2	2008-05-13
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Grant 7,372,051 - Tsuneta , et al. May 13, 2	2008-05-13
Electric Charged Particle Beam Microscopy And Electric Charged Particle Beam Microscope App 20080093551 - TSUNETA; Ruriko ; et al.	2008-04-24
Specimen Analyzing Apparatus and Specimen Holder App 20080067374 - Ono; Shiano ; et al.	2008-03-20
Specified position identifying method and specified position measuring apparatus App 20070274593 - Tsuneta; Ruriko ; et al.	2007-11-29
Scanning transmission electron microscope and scanning transmission electron microscopy App 20070228277 - Tsuneta; Ruriko ; et al.	2007-10-04
Scanning transmission electron microscope and scanning transmission electron microscopy Grant 7,227,144 - Tsuneta , et al. June 5, 2	2007-06-05
Defect inspection instrument and positron beam apparatus Grant 7,141,790 - Koguchi , et al. November 28, 2	2006-11-28
Scanning transmission electron microscope and scanning transmission electron microscopy App 20060151701 - Tsuneta; Ruriko ; et al.	2006-07-13
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system App 20060038125 - Tsuneta; Ruriko ; et al.	2006-02-23
Electron microscope Grant 6,888,139 - Tsuneta , et al. May 3, 2	2005-05-03
Method and apparatus for charged particle beam microscopy Grant 6,838,667 - Tsuneta , et al. January 4, 2	2005-01-04
Defect inspection instrument and positron beam apparatus App 20040227078 - Koguchi, Masanari ; et al.	2004-11-18
Electron microscope App 20030201393 - Tsuneta, Ruriko ; et al.	2003-10-30
Autoadjusting electron microscope Grant 6,570,156 - Tsuneta , et al. May 27, 2	2003-05-27
Network solution system of analysis and evaluation App 20020099573 - Koguchi, Masanari ; et al.	2002-07-25
Method and apparatus for charged particle beam microscopy App 20020056808 - Tsuneta, Ruriko ; et al.	2002-05-16
Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2	2000-04-18
Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1	1999-02-02
Electron microscope Grant 5,650,621 - Tsuneta , et al. July 22, 1	1997-07-22
Electron microscope for specimen composition and strain analysis and observation method thereof Grant 5,453,617 - Tsuneta , et al. September 26, 1	1995-09-26

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