loadpatents
Patent applications and USPTO patent grants for TSUKUDA; Yasuo.The latest application filed is for "analysis device, analysis method, trace liquid collection device, and trace liquid collection method".
Patent | Date |
---|---|
Analysis Device, Analysis Method, Trace Liquid Collection Device, And Trace Liquid Collection Method App 20210349022 - TSUKUDA; Yasuo ;   et al. | 2021-11-11 |
Polishing state monitoring method Grant 8,342,907 - Kobayashi , et al. January 1, 2 | 2013-01-01 |
Spectrophotometer Grant 8,049,884 - Tsukuda November 1, 2 | 2011-11-01 |
Optical measurement device for trace liquid sample Grant 7,830,520 - Tsukuda November 9, 2 | 2010-11-09 |
Polishing State Monitoring Apparatus And Polishing Apparatus And Method App 20100075576 - KOBAYASHI; Yoichi ;   et al. | 2010-03-25 |
Spectrophotometer App 20100045980 - Tsukuda; Yasuo | 2010-02-25 |
Polishing state monitoring apparatus and polishing apparatus Grant 7,645,181 - Kobayashi , et al. January 12, 2 | 2010-01-12 |
Substrate polishing apparatus Grant 7,585,204 - Kobayashi , et al. September 8, 2 | 2009-09-08 |
Spectrophotometric method and apparatus Grant 7,576,855 - Tsukuda August 18, 2 | 2009-08-18 |
Substrate Polishing Apparatus App 20090191790 - KOBAYASHI; Yoichi ;   et al. | 2009-07-30 |
Substrate polishing apparatus Grant 7,547,242 - Hirokawa , et al. June 16, 2 | 2009-06-16 |
Substrate polishing apparatus Grant 7,510,460 - Kobayashi , et al. March 31, 2 | 2009-03-31 |
Optical Measurement Device For Trace Liquid Sample App 20090073435 - Tsukuda; Yasuo | 2009-03-19 |
Polishing state monitoring apparatus and polishing apparatus and method App 20090011680 - Kobayashi; Yoichi ;   et al. | 2009-01-08 |
Polishing state monitoring method Grant 7,438,627 - Kobayashi , et al. October 21, 2 | 2008-10-21 |
Substrate polishing apparatus App 20070254565 - Kobayashi; Yoichi ;   et al. | 2007-11-01 |
Polishing state monitoring apparatus and polishing apparatus and method App 20070254557 - Kobayashi; Yoichi ;   et al. | 2007-11-01 |
Polishing state monitoring apparatus and polishing apparatus and method Grant 7,252,575 - Kobayashi , et al. August 7, 2 | 2007-08-07 |
Substrate polishing apparatus Grant 7,241,202 - Kobayashi , et al. July 10, 2 | 2007-07-10 |
Substrate polishing apparatus App 20070042679 - Hirokawa; Kazuto ;   et al. | 2007-02-22 |
Spectrophotometric method and apparatus App 20060263872 - Tsukuda; Yasuo | 2006-11-23 |
Substrate polishing apparatus Grant 7,101,257 - Hirokawa , et al. September 5, 2 | 2006-09-05 |
Polishing state monitoring apparatus and polishing apparatus and method App 20060166606 - Kobayashi; Yoichi ;   et al. | 2006-07-27 |
Substrate polishing apparatus App 20050239372 - Kobayashi, Yoichi ;   et al. | 2005-10-27 |
Substrate polishing apparatus Grant 6,942,543 - Kobayashi , et al. September 13, 2 | 2005-09-13 |
Substrate polishing apparatus App 20040235393 - Hirokawa, Kazuto ;   et al. | 2004-11-25 |
Substrate polishing apparatus App 20040219865 - Kobayashi, Yoichi ;   et al. | 2004-11-04 |
Substrate polishing apparatus Grant 6,758,723 - Kobayashi , et al. July 6, 2 | 2004-07-06 |
Substrate polishing apparatus App 20030124957 - Kobayashi, Yoichi ;   et al. | 2003-07-03 |
Near infrared analyzer Grant 5,422,483 - Ando , et al. June 6, 1 | 1995-06-06 |
Plasma sprayed film resistor heater Grant 4,808,490 - Tsukuda , et al. February 28, 1 | 1989-02-28 |
Radiation detector Grant 4,733,088 - Yamada , et al. March 22, 1 | 1988-03-22 |
Ferromagnetic amorphous alloy Grant 4,306,908 - Takayama , et al. December 22, 1 | 1981-12-22 |
Method for producing optical fiber preform Grant 4,259,101 - Tsukuda , et al. March 31, 1 | 1981-03-31 |
Method For Producing Highly Pure Sintered Polycrystalline Yttrium Oxide Body Having High Transparency Grant 3,873,657 - Toda , et al. March 25, 1 | 1975-03-25 |
Method For Sintering Very Pure Yttria Compacts To Transparency Grant 3,764,643 - Muta , et al. October 9, 1 | 1973-10-09 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.