Tsukahara; Hiroyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsukahara; Hiroyuki.The latest application filed is for "degradation estimation method, degradation estimation system, and degradation estimation program".

Company Profile

0.8.4

Tsukahara; Hiroyuki - Fuchu JP
Tsukahara; Hiroyuki - Kanagawa JP
Tsukahara; Hiroyuki - Kawasaki JP
Tsukahara; Hiroyuki - Atsugi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Degradation Estimation Method, Degradation Estimation System, And Degradation Estimation Program App 20160377686 - UCHIDA; Katsuya ; et al.	2016-12-29
Compile Method, Computer Program Product, And Semiconductor-integrated-circuit Manufacturing Method App 20100251226 - Sato; Makoto ; et al.	2010-09-30
Phase unwrapping method, program, and interference measurement apparatus Grant 7,593,596 - Takahashi , et al. September 22, 2	2009-09-22
Optical-distortion correcting apparatus and optical-distortion correcting method Grant 7,443,516 - Takahashi , et al. October 28, 2	2008-10-28
Phase unwrapping method, program, and interference measurement apparatus App 20070110334 - Takahashi; Fumiyuki ; et al.	2007-05-17
Optical-distortion correcting apparatus and optical-distortion correcting method App 20060187463 - Takahashi; Fumiyuki ; et al.	2006-08-24
Method and apparatus for visual inspection of bump array Grant 6,104,493 - Fuse , et al. August 15, 2	2000-08-15
Method for inspecting height, and a height inspection apparatus to carry out the method Grant 5,999,266 - Takahashi , et al. December 7, 1	1999-12-07
Optical system for detecting three-dimensional shape Grant 5,004,929 - Kakinoki , et al. April 2, 1	1991-04-02
Pattern matching method and apparatus Grant 4,805,224 - Koezuka , et al. February 14, 1	1989-02-14
Pattern recognition apparatus Grant 4,672,678 - Koezuka , et al. June 9, 1	1987-06-09
Pattern recognition apparatus and a pattern recognition method Grant 4,651,341 - Nakashima , et al. March 17, 1	1987-03-17

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.