Tsukada; Syuichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsukada; Syuichi.The latest application filed is for "probe card".

Company Profile

0.5.6

Tsukada; Syuichi - Yamanashi JP
Tsukada; Syuichi - Nirasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Structure of probe card for inspecting electrical characteristics of object to be inspected Grant 8,723,544 - Komatsu , et al. May 13, 2	2014-05-13
Probing apparatus and method for adjusting probing apparatus Grant 8,063,652 - Amemiya , et al. November 22, 2	2011-11-22
Probe Card App 20110234251 - Komatsu; Shigekazu ; et al.	2011-09-29
Probe device and method of regulating contact pressure between object to be inspected and probe Grant 7,847,569 - Yonezawa , et al. December 7, 2	2010-12-07
Probe card for inspecting electric properties of an object Grant 7,679,385 - Amemiya , et al. March 16, 2	2010-03-16
Probe Device And Method Of Regulating Contact Pressure Between Object To Be Inspected And Probe App 20090284272 - Yonezawa; Toshihiro ; et al.	2009-11-19
Method Of Positioning An Anisotropic Conductive Connector, Method Of Positioning The Anisotropic Conductive Connector And A Circuit Board For Inspection, Anisotropic Conductive Connector, And Probe Card App 20090015281 - Yoshioka; Mutsuhiko ; et al.	2009-01-15
Probe Card App 20080048698 - Amemiya; Takashi ; et al.	2008-02-28
Probe card App 20080007280 - Amemiya; Takashi ; et al.	2008-01-10
Probing apparatus and method for adjusting probing apparatus App 20070108996 - Amemiya; Takashi ; et al.	2007-05-17

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