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Patent applications and USPTO patent grants for Tseng; Chien-Hung.The latest application filed is for "alignment method and associated metrology device".
Patent | Date |
---|---|
Alignment method and associated metrology device Grant 11,372,343 - Van De Groes , et al. June 28, 2 | 2022-06-28 |
Alignment Method And Associated Metrology Device App 20220100107 - VAN DE GROES; Henricus Martinus Johannes ;   et al. | 2022-03-31 |
Metrology method and apparatus and associated computer product Grant 10,551,750 - Urbanczyk , et al. Fe | 2020-02-04 |
Metrology Method and Apparatus and Associated Computer Product App 20190250520 - URBANCZYK; Adam Jan ;   et al. | 2019-08-15 |
Metrology method and apparatus and associated computer product Grant 10,310,388 - Urbanczyk , et al. | 2019-06-04 |
Method and device for focusing in an inspection system Grant 10,107,761 - Shmarev , et al. October 23, 2 | 2018-10-23 |
Metrology Method and Apparatus and Associated Computer Product App 20180217508 - URBANCZYK; Adam ;   et al. | 2018-08-02 |
Method And Device For Focusing In An Inspection System App 20170191944 - SHMAREV; Yevgeniy Konstantinovich ;   et al. | 2017-07-06 |
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