Tseng; Chien-Hung
Patent Applications and Registrations
Patent applications and USPTO patent grants for Tseng; Chien-Hung.The latest application filed is for "alignment method and associated metrology device".
- Tseng; Chien-Hung - Zhubei TW
- TSENG; Chien-Hung - Zhubei City TW
- Tseng; Chien-Hung - Eindhoven NL
- Tseng; Chien-Hung - Wilton CT
| Patent | Date |
|---|---|
| Alignment method and associated metrology device Grant 11,372,343 - Van De Groes , et al. June 28, 2 | 2022-06-28 |
| Alignment Method And Associated Metrology Device App 20220100107 - VAN DE GROES; Henricus Martinus Johannes ; et al. | 2022-03-31 |
| Metrology method and apparatus and associated computer product Grant 10,551,750 - Urbanczyk , et al. Fe | 2020-02-04 |
| Metrology Method and Apparatus and Associated Computer Product App 20190250520 - URBANCZYK; Adam Jan ; et al. | 2019-08-15 |
| Metrology method and apparatus and associated computer product Grant 10,310,388 - Urbanczyk , et al. | 2019-06-04 |
| Method and device for focusing in an inspection system Grant 10,107,761 - Shmarev , et al. October 23, 2 | 2018-10-23 |
| Metrology Method and Apparatus and Associated Computer Product App 20180217508 - URBANCZYK; Adam ; et al. | 2018-08-02 |
| Method And Device For Focusing In An Inspection System App 20170191944 - SHMAREV; Yevgeniy Konstantinovich ; et al. | 2017-07-06 |
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