Tsen; Andy

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsen; Andy.The latest application filed is for "method and system for implementing virtual metrology in semiconductor fabrication".

Company Profile

0.16.12

Tsen; Andy - Chung-Ho TW
Tsen; Andy - Chung-Ho City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for implementing a virtual metrology advanced process control platform Grant 8,437,870 - Tsai , et al. May 7, 2	2013-05-07
System and method for implementing multi-resolution advanced process control Grant 8,394,719 - Tsen , et al. March 12, 2	2013-03-12
Method and system for implementing virtual metrology in semiconductor fabrication Grant 8,396,583 - Tsai , et al. March 12, 2	2013-03-12
Advanced process control with novel sampling policy Grant 8,392,009 - Fei , et al. March 5, 2	2013-03-05
Advanced process control for new tapeout product Grant 8,239,056 - Hsu , et al. August 7, 2	2012-08-07
Method and system for tuning advanced process control parameters Grant 8,229,588 - Tsen , et al. July 24, 2	2012-07-24
Method and apparatus for advanced process control Grant 8,224,475 - Tsai , et al. July 17, 2	2012-07-17
System and method for implementing wafer acceptance test ("WAT") advanced process control ("APC") with routing model Grant 8,219,341 - Tsen , et al. July 10, 2	2012-07-10
System and method for implementing a wafer acceptance test ("WAT") advanced process control ("APC") with novel sampling policy and architecture Grant 8,108,060 - Tsen , et al. January 31, 2	2012-01-31
Method for a bin ratio forecast at new tape out stage Grant 8,082,055 - Lin , et al. December 20, 2	2011-12-20
Method for bin-based control Grant 8,041,451 - Wu , et al. October 18, 2	2011-10-18
Method And System For Implementing Virtual Metrology In Semiconductor Fabrication App 20110238198 - Tsai; Po-Feng ; et al.	2011-09-29
System And Method For Implementing Multi-resolution Advanced Process Control App 20110213478 - Tsen; Andy ; et al.	2011-09-01
System and method for implementing multi-resolution advanced process control Grant 7,951,615 - Tsen , et al. May 31, 2	2011-05-31
Advanced Process Control For New Tapeout Product App 20110112678 - Hsu; Chih-Wei ; et al.	2011-05-12
Method For A Bin Ratio Forecast At New Tape Out Stage App 20110010215 - Lin; Chun-Hsien ; et al.	2011-01-13
System And Method For Implementing A Virtual Metrology Advanced Process Control Platform App 20100312374 - Tsai; Po-Feng ; et al.	2010-12-09
System And Method For Implementing A Wafer Acceptance Test ("wat") Advanced Process Control ("apc") With Novel Sampling Policy And Architecture App 20100292824 - Tsen; Andy ; et al.	2010-11-18
Method For Bin-based Control App 20100268367 - Wu; Sunny ; et al.	2010-10-21
System And Method For Implementing Multi-resolution Advanced Process Control App 20100255613 - Tsen; Andy ; et al.	2010-10-07
Advanced Process Control With Novel Sampling Policy App 20100249974 - Fei; Wang Jo ; et al.	2010-09-30
System And Method For Implementing Wafer Acceptance Test ("wat") Advanced Process Control ("apc") With Routing Model App 20100250172 - Tsen; Andy ; et al.	2010-09-30
Method And Apparatus For Advanced Process Control App 20100234970 - Tsai; Po-Feng ; et al.	2010-09-16
Method And System For Tuning Advanced Process Control Parameters App 20100228370 - Tsen; Andy ; et al.	2010-09-09

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