Tsai; Wei-Chun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Tsai; Wei-Chun.The latest application filed is for "devices and methods for detecting cancerous cells".

Company Profile

3.14.16

Tsai; Wei-Chun - Hsinchu TW
Tsai; Wei-Chun - Hsin-Chu TW
Tsai; Wei-Chun - Hsin-chu City TW
Tsai; Wei-Chun - Taoyuan County TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Forming STI regions to separate semiconductor Fins Grant 11,450,661 - Hsu , et al. September 20, 2	2022-09-20
Self-aligned passivation of active regions Grant 10,943,995 - Wann , et al. March 9, 2	2021-03-09
Devices And Methods For Detecting Cancerous Cells App 20210046479 - HUNG; Shang-Cheng ; et al.	2021-02-18
Method For Detecting Cholangiocarcinoma Cells App 20200355692 - Lee; Gwo Bin ; et al.	2020-11-12
System and method for test key characterizing wafer processing state Grant 10,535,573 - Wann , et al. Ja	2020-01-14
System and Method for Test Key Characterizing Wafer Processing State App 20190237370 - Wann; Clement Hsingjen ; et al.	2019-08-01
Self-Aligned Passivation of Active Regions App 20190123179 - Wann; Clement Hsingjen ; et al.	2019-04-25
System and method for test key characterizing wafer processing state Grant 10,269,666 - Wann , et al.	2019-04-23
Self-aligned passivation of active regions Grant 10,164,070 - Wann , et al. Dec	2018-12-25
Self-Aligned Passivation of Active Regions App 20180308955 - Wann; Clement Hsingjen ; et al.	2018-10-25
Methods for Forming STI Regions in Integrated Circuits App 20180247935 - Hsu; Chih-Yu ; et al.	2018-08-30
Self-aligned passivation of active regions Grant 10,032,889 - Wann , et al. July 24, 2	2018-07-24
Methods for forming STI regions in integrated circuits Grant 9,953,975 - Hsu , et al. April 24, 2	2018-04-24
Methods for probing semiconductor fins through four-point probe and determining carrier concentrations Grant 9,627,280 - Wann , et al. April 18, 2	2017-04-18
System and Method for Test Key Characterizing Wafer Processing State App 20160372390 - Wann; Clement Hsingjen ; et al.	2016-12-22
Self-Aligned Passivation of Active Regions App 20160343832 - Wann; Clement Hsingjen ; et al.	2016-11-24
Methods for Probing Semiconductor Fins and Determining Carrier Concentrations App 20160268174 - Wann; Clement Hsingjen ; et al.	2016-09-15
System and method for test key characterizing wafer processing state Grant 9,431,288 - Wann , et al. August 30, 2	2016-08-30
Self-aligned passivation of active regions Grant 9,412,847 - Wann , et al. August 9, 2	2016-08-09
Methods for probing semiconductor fins and determining carrier concentrations therein Grant 9,349,659 - Wann , et al. May 24, 2	2016-05-24
Calculating Carrier Concentrations in Semiconductor Fins Using Probed Resistance App 20150287652 - Wann; Clement Hsingjen ; et al.	2015-10-08
Calculating carrier concentrations in semiconductor Fins using probed resistance Grant 9,093,335 - Wann , et al. July 28, 2	2015-07-28
System and Method for Test Key Characterizing Wafer Processing State App 20150076499 - Wann; Clement Hsingjen ; et al.	2015-03-19
Methods for Forming STI Regions in Integrated Circuits App 20150021710 - Hsu; Chih-Yu ; et al.	2015-01-22
Self-Aligned Passivation of Active Regions App 20140256105 - Wann; Clement Hsingjen ; et al.	2014-09-11
Method for Determining Carrier Concentrations in Semiconductor Fins App 20140147943 - Wann; Clement Hsingjen ; et al.	2014-05-29
Electronic device and pin thereof Grant 8,460,014 - Yeh , et al. June 11, 2	2013-06-11
Electronic Device And Pin Thereof App 20130017740 - Yeh; Chang-Hsing ; et al.	2013-01-17

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