loadpatents
Patent applications and USPTO patent grants for Tsai; Wei-Chun.The latest application filed is for "devices and methods for detecting cancerous cells".
Patent | Date |
---|---|
Forming STI regions to separate semiconductor Fins Grant 11,450,661 - Hsu , et al. September 20, 2 | 2022-09-20 |
Self-aligned passivation of active regions Grant 10,943,995 - Wann , et al. March 9, 2 | 2021-03-09 |
Devices And Methods For Detecting Cancerous Cells App 20210046479 - HUNG; Shang-Cheng ;   et al. | 2021-02-18 |
Method For Detecting Cholangiocarcinoma Cells App 20200355692 - Lee; Gwo Bin ;   et al. | 2020-11-12 |
System and method for test key characterizing wafer processing state Grant 10,535,573 - Wann , et al. Ja | 2020-01-14 |
System and Method for Test Key Characterizing Wafer Processing State App 20190237370 - Wann; Clement Hsingjen ;   et al. | 2019-08-01 |
Self-Aligned Passivation of Active Regions App 20190123179 - Wann; Clement Hsingjen ;   et al. | 2019-04-25 |
System and method for test key characterizing wafer processing state Grant 10,269,666 - Wann , et al. | 2019-04-23 |
Self-aligned passivation of active regions Grant 10,164,070 - Wann , et al. Dec | 2018-12-25 |
Self-Aligned Passivation of Active Regions App 20180308955 - Wann; Clement Hsingjen ;   et al. | 2018-10-25 |
Methods for Forming STI Regions in Integrated Circuits App 20180247935 - Hsu; Chih-Yu ;   et al. | 2018-08-30 |
Self-aligned passivation of active regions Grant 10,032,889 - Wann , et al. July 24, 2 | 2018-07-24 |
Methods for forming STI regions in integrated circuits Grant 9,953,975 - Hsu , et al. April 24, 2 | 2018-04-24 |
Methods for probing semiconductor fins through four-point probe and determining carrier concentrations Grant 9,627,280 - Wann , et al. April 18, 2 | 2017-04-18 |
System and Method for Test Key Characterizing Wafer Processing State App 20160372390 - Wann; Clement Hsingjen ;   et al. | 2016-12-22 |
Self-Aligned Passivation of Active Regions App 20160343832 - Wann; Clement Hsingjen ;   et al. | 2016-11-24 |
Methods for Probing Semiconductor Fins and Determining Carrier Concentrations App 20160268174 - Wann; Clement Hsingjen ;   et al. | 2016-09-15 |
System and method for test key characterizing wafer processing state Grant 9,431,288 - Wann , et al. August 30, 2 | 2016-08-30 |
Self-aligned passivation of active regions Grant 9,412,847 - Wann , et al. August 9, 2 | 2016-08-09 |
Methods for probing semiconductor fins and determining carrier concentrations therein Grant 9,349,659 - Wann , et al. May 24, 2 | 2016-05-24 |
Calculating Carrier Concentrations in Semiconductor Fins Using Probed Resistance App 20150287652 - Wann; Clement Hsingjen ;   et al. | 2015-10-08 |
Calculating carrier concentrations in semiconductor Fins using probed resistance Grant 9,093,335 - Wann , et al. July 28, 2 | 2015-07-28 |
System and Method for Test Key Characterizing Wafer Processing State App 20150076499 - Wann; Clement Hsingjen ;   et al. | 2015-03-19 |
Methods for Forming STI Regions in Integrated Circuits App 20150021710 - Hsu; Chih-Yu ;   et al. | 2015-01-22 |
Self-Aligned Passivation of Active Regions App 20140256105 - Wann; Clement Hsingjen ;   et al. | 2014-09-11 |
Method for Determining Carrier Concentrations in Semiconductor Fins App 20140147943 - Wann; Clement Hsingjen ;   et al. | 2014-05-29 |
Electronic device and pin thereof Grant 8,460,014 - Yeh , et al. June 11, 2 | 2013-06-11 |
Electronic Device And Pin Thereof App 20130017740 - Yeh; Chang-Hsing ;   et al. | 2013-01-17 |
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