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Multi-stage machine learning-based chain diagnosis
Grant 11,361,248 - Huang , et al. June 14, 2 | 2022-06-14 |
Deterministic test pattern generation for designs with timing exceptions
Grant 10,977,400 - Cheng , et al. April 13, 2 | 2021-04-13 |
Deterministic Test Pattern Generation For Designs With Timing Exceptions
App 20200410065 - Cheng; Wu-Tung ; et al. | 2020-12-31 |
Timing-aware test generation and fault simulation
Grant 10,509,073 - Lin , et al. Dec | 2019-12-17 |
Multi-Stage Machine Learning-Based Chain Diagnosis
App 20190220776 - Huang; Yu ; et al. | 2019-07-18 |
Input Data Compression For Machine Learning-Based Chain Diagnosis
App 20190220745 - Huang; Yu ; et al. | 2019-07-18 |
Wide-range clock signal generation for speed grading of logic cores
Grant 10,317,462 - Huang , et al. | 2019-06-11 |
Timing-aware Test Generation And Fault Simulation
App 20180045780 - Lin; Xijiang ; et al. | 2018-02-15 |
Wide-Range Clock Signal Generation For Speed Grading Of Logic Cores
App 20170328952 - Huang; Shi-Yu ; et al. | 2017-11-16 |
Timing-aware test generation and fault simulation
Grant 9,720,040 - Lin , et al. August 1, 2 | 2017-08-01 |
Method and circuit of pulse-vanishing test
Grant 9,720,038 - Huang , et al. August 1, 2 | 2017-08-01 |
Timing-aware Test Generation And Fault Simulation
App 20150323600 - Lin; Xijiang ; et al. | 2015-11-12 |
Timing-aware test generation and fault simulation
Grant 9,086,454 - Lin , et al. July 21, 2 | 2015-07-21 |
Method and Circuit Of Pulse-Vanishing Test
App 20140347088 - Huang; Shi-Yu ; et al. | 2014-11-27 |
Programmable Leakage Test For Interconnects In Stacked Designs
App 20140246705 - Huang; Shi-Yu ; et al. | 2014-09-04 |
Timing-aware Test Generation And Fault Simulation
App 20140047404 - Lin; Xijiang ; et al. | 2014-02-13 |
Timing-aware test generation and fault simulation
Grant 8,560,906 - Lin , et al. October 15, 2 | 2013-10-15 |
Diagnostic test pattern generation for small delay defect
Grant 8,527,232 - Guo , et al. September 3, 2 | 2013-09-03 |
Speed-path debug using at-speed scan test patterns
Grant 8,468,409 - Guo , et al. June 18, 2 | 2013-06-18 |
Compactor independent fault diagnosis
Grant 8,301,414 - Cheng , et al. October 30, 2 | 2012-10-30 |
Timing-aware Test Generation And Fault Simulation
App 20120174049 - Lin; Xijiang ; et al. | 2012-07-05 |
Timing-aware test generation and fault simulation
Grant 8,051,352 - Lin , et al. November 1, 2 | 2011-11-01 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths
Grant 7,984,354 - Goswami , et al. July 19, 2 | 2011-07-19 |
Diagnostic Test Pattern Generation For Small Delay Defect
App 20100274518 - Guo; Ruifeng ; et al. | 2010-10-28 |
Speed-Path Debug Using At-Speed Scan Test Patterns
App 20100185908 - Guo; Ruifeng ; et al. | 2010-07-22 |
Generating Responses To Patterns Stimulating An Electronic Circuit With Timing Exception Paths
App 20090327986 - Goswami; Dhiraj ; et al. | 2009-12-31 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths
Grant 7,555,689 - Goswami , et al. June 30, 2 | 2009-06-30 |
Timing-aware test generation and fault simulation
App 20070288822 - Lin; Xijiang ; et al. | 2007-12-13 |
Compactor Independent Fault Diagnosis
App 20070283202 - Cheng; Wu-Tung ; et al. | 2007-12-06 |
Compactor independent fault diagnosis
Grant 7,239,978 - Cheng , et al. July 3, 2 | 2007-07-03 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths
App 20070011527 - Goswami; Dhiraj ; et al. | 2007-01-11 |
Compactor independent fault diagnosis
App 20050222816 - Cheng, Wu-Tung ; et al. | 2005-10-06 |
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