Patent | Date |
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Methods for inspecting semiconductor wafers Grant 10,502,687 - Trupke , et al. Dec | 2019-12-10 |
Methods For Inspecting Semiconductor Wafers App 20190178800 - TRUPKE; Thorsten ;   et al. | 2019-06-13 |
Methods for inspecting semiconductor wafers Grant 10,241,051 - Trupke , et al. | 2019-03-26 |
Determining The Condition Of Photovoltaic Modules App 20180159468 - TRUPKE; Thorsten ;   et al. | 2018-06-07 |
Determining The Condition Of Photovoltaic Modules App 20180159469 - TRUPKE; Thorsten ;   et al. | 2018-06-07 |
Methods For Inspecting Semiconductor Wafers App 20180136130 - TRUPKE; Thorsten ;   et al. | 2018-05-17 |
Method and system for inspecting indirect bandgap semiconductor structure Grant 9,909,991 - Trupke , et al. March 6, 2 | 2018-03-06 |
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Grant 9,912,291 - Trupke , et al. March 6, 2 | 2018-03-06 |
Methods for inspecting semiconductor wafers Grant 9,885,662 - Trupke , et al. February 6, 2 | 2018-02-06 |
Method And System For Testing Indirect Bandgap Semiconductor Devices Using Luminescence Imaging App 20170033736 - TRUPKE; Thorsten ;   et al. | 2017-02-02 |
Wafer imaging and processing method and apparatus Grant 9,546,955 - Trupke , et al. January 17, 2 | 2017-01-17 |
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Grant 9,482,625 - Trupke , et al. November 1, 2 | 2016-11-01 |
Method And System For Inspecting Indirect Bandgap Semiconductor Structure App 20160116412 - Trupke; Thorsten ;   et al. | 2016-04-28 |
Separation Of Doping Density And Minority Carrier Lifetime In Photoluminescence Measurements On Semiconductor Materials App 20160084764 - TRUPKE; Thorsten | 2016-03-24 |
Method and system for inspecting indirect bandgap semiconductor structure Grant 9,234,849 - Trupke , et al. January 12, 2 | 2016-01-12 |
Wafer Imaging And Processing Method And Apparatus App 20150323457 - TRUPKE; Thorsten ;   et al. | 2015-11-12 |
Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials Grant 9,157,863 - Trupke October 13, 2 | 2015-10-13 |
Wafer imaging and processing method and apparatus Grant 9,103,792 - Trupke , et al. August 11, 2 | 2015-08-11 |
In-line Photoluminescence Imaging Of Semiconductor Devices App 20150219560 - MAXWELL; Ian Andrew ;   et al. | 2015-08-06 |
Methods For Inspecting Semiconductor Wafers App 20150168303 - Trupke; Thorsten ;   et al. | 2015-06-18 |
In-line photoluminescence imaging of semiconductor devices Grant 9,035,267 - Maxwell , et al. May 19, 2 | 2015-05-19 |
Separation Of Doping Density And Minority Carrier Lifetime In Photoluminescence Measurements On Semiconductor Materials App 20140224965 - TRUPKE; Thorsten | 2014-08-14 |
Method And System For Testing Indirect Bandgap Semiconductor Devices Using Luminescence Imaging App 20140191776 - TRUPKE; Thorsten ;   et al. | 2014-07-10 |
Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials Grant 8,742,372 - Trupke June 3, 2 | 2014-06-03 |
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Grant 8,710,860 - Trupke , et al. April 29, 2 | 2014-04-29 |
Quantitative Series Resistance Imaging Of Photovoltaic Cells App 20140039820 - Trupke; Thorsten ;   et al. | 2014-02-06 |
Photovoltaic cell manufacturing Grant 8,483,476 - Bardos , et al. July 9, 2 | 2013-07-09 |
Illumination Systems and Methods for Photoluminescence Imaging of Photovoltaic Cells and Wafers App 20130062536 - Bardos; Robert A. ;   et al. | 2013-03-14 |
In-Line Photoluminescence Imaging of Semiconductor Devices App 20130043405 - Maxwell; Ian Andrew ;   et al. | 2013-02-21 |
Method And System For Inspecting Indirect Bandgap Semiconductor Structure App 20120257044 - Trupke; Thorsten ;   et al. | 2012-10-11 |
Separation Of Doping Density And Minority Carrier Lifetime In Photoluminescence Measurements On Semiconductor Materials App 20120181452 - Trupke; Thorsten | 2012-07-19 |
Method and system for inspecting indirect bandgap semiconductor stucture Grant 8,218,140 - Trupke , et al. July 10, 2 | 2012-07-10 |
Photoluminescence Imaging Systems For Silicon Photovoltaic Cell Manufacturing App 20120142125 - Trupke; Thorsten ;   et al. | 2012-06-07 |
Method and System for Inspecting Indirect Bandgap Semiconductor Structure App 20120033067 - Trupke; Thorsten ;   et al. | 2012-02-09 |
Method and system for inspecting indirect bandgap semiconductor structure Grant 8,064,054 - Trupke , et al. November 22, 2 | 2011-11-22 |
Photovoltaic Cell Manufacturing App 20110188733 - Bardos; Robert Andrew ;   et al. | 2011-08-04 |
Thin Film Imaging Method And Apparatus App 20110117681 - Bardos; Robert Andrew ;   et al. | 2011-05-19 |
Determining diffusion length of minority carriers using luminescence Grant 7,919,762 - Trupke , et al. April 5, 2 | 2011-04-05 |
Wafer Imaging And Processing Method And Apparatus App 20110025839 - Trupke; Thorsten ;   et al. | 2011-02-03 |
Determining Diffusion Length Of Minority Carriers Using Luminescence App 20100025588 - Trupke; Thorsten ;   et al. | 2010-02-04 |
Method And System For Testing Indirect Bandgap Semiconductor Devices Using Luminescence Imaging App 20090206287 - Trupke; Thorsten ;   et al. | 2009-08-20 |
Method and System for Inspecting Indirect Bandgap Semiconductor Structure App 20090051914 - Trupke; Thorsten ;   et al. | 2009-02-26 |