Trikas; Thanassis

Patent Applications and Registrations

Patent applications and USPTO patent grants for Trikas; Thanassis.The latest application filed is for "methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool".

Company Profile

0.10.10

Trikas; Thanassis - Redwood City CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool Grant 8,831,767 - Lehman , et al. September 9, 2	2014-09-09
Methods And Systems For Monitoring A Parameter Of A Measurement Device During Polishing, Damage To A Specimen During Polishing, Or A Characteristic Of A Polishing Pad Or Tool App 20110313558 - Lehman; Kurt ; et al.	2011-12-22
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool Grant 8,010,222 - Lehman , et al. August 30, 2	2011-08-30
Methods And Systems For Monitoring A Parameter Of A Measurement Device During Polishing, Damage To A Specimen During Polishing, Or A Characteristic Of A Polishing Pad Or Tool App 20080207089 - Lehman; Kurt ; et al.	2008-08-28
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool Grant 7,332,438 - Lehman , et al. February 19, 2	2008-02-19
Methods and systems for determining a characteristic of polishing within a zone on a specimen from combined output signals of an eddy current device Grant 7,175,503 - Lehman , et al. February 13, 2	2007-02-13
Methods and systems for detecting a presence of blobs on a specimen during a polishing process App 20060148383 - Lehman; Kurt ; et al.	2006-07-06
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool App 20060131273 - Lehman; Kurt ; et al.	2006-06-22
Methods and systems for detecting a presence of blobs on a specimen during a polishing process Grant 7,052,369 - Lehman , et al. May 30, 2	2006-05-30
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool Grant 7,030,018 - Lehman , et al. April 18, 2	2006-04-18
Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing Grant 6,935,922 - Lehman , et al. August 30, 2	2005-08-30
Systems and methods for characterizing a polishing process Grant 6,884,146 - Lehman , et al. April 26, 2	2005-04-26
Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad Grant 6,866,559 - Lehman , et al. March 15, 2	2005-03-15
Methods and systems for detecting a presence of blobs on a specimen during a polishing process App 20030190864 - Lehman, Kurt ; et al.	2003-10-09
Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool App 20030180973 - Lehman, Kurt ; et al.	2003-09-25
Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad App 20030181139 - Lehman, Kurt ; et al.	2003-09-25
Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing App 20030181132 - Lehman, Kurt ; et al.	2003-09-25
Methods and systems for determining a characteristic of polishing within a zone on a specimen from combined output signals of an eddy current device App 20030181138 - Lehman, Kurt ; et al.	2003-09-25
Systems and methods for characterizing a polishing process App 20030181131 - Lehman, Kurt ; et al.	2003-09-25

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.