loadpatents
Patent applications and USPTO patent grants for Tregub; Alexander.The latest application filed is for "chemical-mechanical planarization (cmp) pad conditioner brush-and-abrasive hybrid for multi-step, preparation- and restoration-c".
Patent | Date |
---|---|
Chemical-mechanical Planarization (cmp) Pad Conditioner Brush-and-abrasive Hybrid For Multi-step, Preparation- And Restoration-c App 20190193245 - Tregub; Alexander ;   et al. | 2019-06-27 |
Mounting a pellicle to a frame Grant 8,551,675 - Eschbach , et al. October 8, 2 | 2013-10-08 |
Mounting A Pellicle To A Frame App 20110294048 - Eschbach; Florence ;   et al. | 2011-12-01 |
Mounting a pellicle to a frame Grant 8,012,651 - Eschbach , et al. September 6, 2 | 2011-09-06 |
Brush for cleaning wafer Grant 7,469,443 - Liou , et al. December 30, 2 | 2008-12-30 |
Detecting particle agglomeration in chemical mechanical polishing slurries Grant 7,383,723 - Tregub , et al. June 10, 2 | 2008-06-10 |
Mounting a Pellicle to a Frame App 20080094591 - Eschbach; Florence ;   et al. | 2008-04-24 |
Mounting a pellicle to a frame Grant 7,316,869 - Eschbach , et al. January 8, 2 | 2008-01-08 |
Process to optimize properties of polymer pellicles and resist for lithography applications Grant 7,314,667 - Tregub , et al. January 1, 2 | 2008-01-01 |
Fullerenes to increase radiation resistance in polymer-based pellicles Grant 7,288,300 - Tregub , et al. October 30, 2 | 2007-10-30 |
Fullerenes to increase radiation resistance in polymer-based pellicles Grant 7,288,299 - Tregub , et al. October 30, 2 | 2007-10-30 |
Attaching a pellicle frame to a reticle Grant 7,264,853 - Eschbach , et al. September 4, 2 | 2007-09-04 |
Hardened porous polymer chemical mechanical polishing (CMP) pad App 20070117393 - Tregub; Alexander ;   et al. | 2007-05-24 |
Use of alternative polymer materials for "soft" polymer pellicles App 20070037074 - Tregub; Alexander ;   et al. | 2007-02-15 |
Method of manufacturing a polymer memory device App 20070003695 - Tregub; Alexander ;   et al. | 2007-01-04 |
Treatment of CMP pad window to improve transmittance App 20060291530 - Tregub; Alexander ;   et al. | 2006-12-28 |
Detecting particle agglomeration in chemical mechanical polishing slurries App 20060266736 - Tregub; Alexander ;   et al. | 2006-11-30 |
Radiation stability of polymer pellicles App 20060234134 - Tregub; Alexander ;   et al. | 2006-10-19 |
Brush for cleaning wafer App 20060151003 - Liou; Huey-Chiang ;   et al. | 2006-07-13 |
Conditioning polishing pad for chemical-mechanical polishing Grant 7,048,610 - Tregub , et al. May 23, 2 | 2006-05-23 |
Fullerences to increase radiation resistance in polymer-based pellicles App 20060008528 - Tregub; Alexander ;   et al. | 2006-01-12 |
Anti-bacterial protection to improve performance of post CMP clean brush App 20050287032 - Tregub, Alexander ;   et al. | 2005-12-29 |
Use of alternative polymer materials for "soft" polymer pellicles App 20050202252 - Tregub, Alexander ;   et al. | 2005-09-15 |
Process to optimize properties of polymer pellicles and resist for lithography applications App 20050203254 - Tregub, Alexander ;   et al. | 2005-09-15 |
Attaching a pellicle frame to a reticle App 20050045262 - Eschbach, Florence ;   et al. | 2005-03-03 |
Mounting a pellicle to a frame App 20050048376 - Eschbach, Florence ;   et al. | 2005-03-03 |
Fullerenes to increase radiation resistance in polymer-based pellicles App 20050029126 - Tregub, Alexander ;   et al. | 2005-02-10 |
Annealing of CMP polishing pads App 20030207661 - Tregub, Alexander ;   et al. | 2003-11-06 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.