name:-0.014094114303589
name:-0.014441013336182
name:-0.004533052444458
Translarity, Inc. Patent Filings

Translarity, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Translarity, Inc..The latest application filed is for "redistribution plate".

Company Profile
2.17.19
  • Translarity, Inc. - Fremont CA US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Redistribution Plate
App 20210243896 - Schmidt; Dominik ;   et al.
2021-08-05
Wafer testing system and associated methods of use and manufacture
Grant 10,571,489 - Durbin , et al. Feb
2020-02-25
Probe card for testing semiconductor wafers
Grant 10,281,491 - McQuade , et al.
2019-05-07
Designed Asperity Contactors, Including Nanospikes, For Semiconductor Test, And Associated Systems And Methods
App 20180003737 - Preston; Douglas A. ;   et al.
2018-01-04
Semiconductor Tests Using Interposers, And Associated Systems And Methods
App 20170292992 - Lane; Christopher T. ;   et al.
2017-10-12
Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods
Grant 9,733,272 - Preston , et al. August 15, 2
2017-08-15
Wafer Testing System And Associated Methods Of Use And Manufacture
App 20170219629 - Durbin; Aaron ;   et al.
2017-08-03
Wafer Prober Integrated With Full-wafer Contactor
App 20170219627 - Johnson; Morgan T.
2017-08-03
Wafer testing system and associated methods of use and manufacture
Grant 9,612,259 - Durbin , et al. April 4, 2
2017-04-04
Wafer prober integrated with full-wafer contacter
Grant 9,612,278 - Johnson April 4, 2
2017-04-04
Designed Asperity Contactors, Including Nanospikes, For Semiconductor Test Using A Package, And Associated Systems And Methods
App 20170074904 - Preston; Douglas A. ;   et al.
2017-03-16
Interdigitized Polysymmetric Fanouts, And Associated Systems And Methods
App 20170023616 - Johnson; Morgan T.
2017-01-26
Lost Motion Gasket For Semiconductor Test, And Associated Systems And Methods
App 20170023642 - Preston; Douglas A. ;   et al.
2017-01-26
Shaping Of Contact Structures For Semiconductor Test, And Associated Systems And Methods
App 20170023617 - Ruffler; Jens ;   et al.
2017-01-26
Systems And Methods For Generating And Preserving Vacuum Between Semiconductor Wafer And Wafer Translator
App 20170016954 - Kalnin; Nikolai ;   et al.
2017-01-19
Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods
Grant 9,494,618 - Preston , et al. November 15, 2
2016-11-15
Full-water test and burn-in mechanism
Grant RE46,075 - Johnson July 19, 2
2016-07-19
Wafer Prober Integrated With Full-wafer Contacter
App 20160033569 - Johnson; Morgan T.
2016-02-04
Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods
Grant 9,222,965 - Johnson December 29, 2
2015-12-29
Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed
Grant 9,176,186 - Durbin , et al. November 3, 2
2015-11-03
Maintaining a wafer/wafer translator pair in an attached state free of a gasket diposed
Grant 9,146,269 - Durbin , et al. September 29, 2
2015-09-29
Wafer prober integrated with full-wafer contactor
Grant 9,052,355 - Johnson June 9, 2
2015-06-09

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