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High Power Device Fault Localization Via Die Surface Contouring
App 20220155049 - Lewison; David J. ; et al. | 2022-05-19 |
Built-in device testing of integrated circuits
Grant 10,768,230 - Casatuta , et al. Sep | 2020-09-08 |
Iterative N-detect based logic diagnostic technique
Grant 10,254,336 - Kusko , et al. | 2019-04-09 |
Dynamic fault model generation for diagnostics simulation and pattern generation
Grant 10,169,510 - Kusko , et al. J | 2019-01-01 |
Iterative N-detect Based Logic Diagnostic Technique
App 20180252769 - KUSKO; Mary P. ; et al. | 2018-09-06 |
Iterative N-detect based logic diagnostic technique
Grant 10,024,910 - Kusko , et al. July 17, 2 | 2018-07-17 |
Dynamic Fault Model Generation For Diagnostics Simulation And Pattern Generation
App 20180075170 - KUSKO; Mary P. ; et al. | 2018-03-15 |
Dynamic fault model generation for diagnostics simulation and pattern generation
Grant 9,852,245 - Kusko , et al. December 26, 2 | 2017-12-26 |
Built-in Device Testing Of Integrated Circuits
App 20170343601 - Casatuta; Robert M. ; et al. | 2017-11-30 |
Iterative N-detect Based Logic Diagnostic Technique
App 20170219651 - Kusko; Mary P. ; et al. | 2017-08-03 |
Dynamic Fault Model Generation For Diagnostics Simulation And Pattern Generation
App 20170199946 - Kusko; Mary P. ; et al. | 2017-07-13 |
Dynamic fault model generation for diagnostics simulation and pattern generation
Grant 9,552,449 - Kusko , et al. January 24, 2 | 2017-01-24 |
Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns
Grant 8,086,924 - Forlenza , et al. December 27, 2 | 2011-12-27 |
Implementing isolation of VLSI scan chain using ABIST test patterns
Grant 8,065,575 - Forlenza , et al. November 22, 2 | 2011-11-22 |
Method and apparatus for performing logic built-in self-testing of an integrated circuit
Grant 7,934,134 - Forlenza , et al. April 26, 2 | 2011-04-26 |
AC ABIST diagnostic method, apparatus and program product
Grant 7,930,601 - Eckelman , et al. April 19, 2 | 2011-04-19 |
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)
Grant 7,921,346 - Forlenza , et al. April 5, 2 | 2011-04-05 |
Diagnosable general purpose test registers scan chain design
Grant 7,908,534 - Motika , et al. March 15, 2 | 2011-03-15 |
Automated system and processing for expedient diagnosis of broken shift registers latch chains
Grant 7,908,532 - Eckelman , et al. March 15, 2 | 2011-03-15 |
Method for enhancing the diagnostic accuracy of a VLSI chip
Grant 7,831,863 - Kusko , et al. November 9, 2 | 2010-11-09 |
Verification Of Array Built-in Self-test (abist) Design-for-test/design-for-diagnostics (dft/dfd)
App 20100115337 - Forlenza; Donato Orazio ; et al. | 2010-05-06 |
Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns
App 20100095169 - Forlenza; Donato Orazio ; et al. | 2010-04-15 |
Implementing Diagnosis of Transitional Scan Chain Defects Using LBIST Test Patterns
App 20100095177 - Forlenza; Donato Orazio ; et al. | 2010-04-15 |
Method And Apparatus For Performing Logic Built-in Self-testing Of An Integrated Circuit
App 20090307548 - Forlenza; Donato O. ; et al. | 2009-12-10 |
AC ABIST Diagnostic Method, Apparatus and Program Product
App 20090217112 - Eckelman; Joseph ; et al. | 2009-08-27 |
Diagnosable General Purpose Test Registers Scan Chain Design
App 20090217116 - Motika; Franco ; et al. | 2009-08-27 |
AC Scan Diagnostic Method and Apparatus Utilizing Functional Architecture Verification Patterns
App 20090210761 - Forlenza; Donato O. ; et al. | 2009-08-20 |
Automated System and Processing for Expedient Diagnosis of Broken Shift Registers Latch Chains Using JTAG
App 20090210763 - Eckelman; Joseph ; et al. | 2009-08-20 |
implementing deterministic based broken scan chain diagnostics
Grant 7,475,308 - Anderson , et al. January 6, 2 | 2009-01-06 |
Apparatus, And Computer Program Product For Implementing Deterministic Based Broken Scan Chain Diagnostics
App 20080189583 - Anderson; Adrian C. ; et al. | 2008-08-07 |
Method For Enhancing The Diagnostic Accuracy Of A Vlsi Chip
App 20080172576 - Kusko; Mary P. ; et al. | 2008-07-17 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
Grant 7,395,470 - Burdine , et al. July 1, 2 | 2008-07-01 |
Method for implementing deterministic based broken scan chain diagnostics
Grant 7,395,469 - Anderson , et al. July 1, 2 | 2008-07-01 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
Grant 7,392,449 - Burdine , et al. June 24, 2 | 2008-06-24 |
Iterative Test Generation And Diagnostic Method Based On Modeled And Unmodeled Faults
App 20080115029 - Kusko; Mary P. ; et al. | 2008-05-15 |
Method, Apparatus, And Computer Program Product For Diagnosing A Scan Chain Failure Employing Fuses Coupled To The Scan Chain
App 20080091999 - BURDINE; Todd M. ; et al. | 2008-04-17 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
App 20070011523 - Burdine; Todd M. ; et al. | 2007-01-11 |
Diagnostic method for structural scan chain designs
Grant 6,961,886 - Motika , et al. November 1, 2 | 2005-11-01 |
Method, apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics
App 20050229057 - Anderson, Adrian C. ; et al. | 2005-10-13 |
Diagnostic Method For Structural Scan Chain Designs
App 20040210808 - Motika, Franco ; et al. | 2004-10-21 |
Automatic transmission shifter with manual shift mode
Grant 5,791,197 - Rempinski , et al. August 11, 1 | 1998-08-11 |
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