Toyokawa; Hiroyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Toyokawa; Hiroyuki.The latest application filed is for "nondestructive inspection system using nuclear resonance fluorescence".
- Toyokawa; Hiroyuki - Ibaraki JP
| Patent | Date |
|---|---|
| Nondestructive inspection system using nuclear resonance fluorescence Grant 8,804,911 - Toyokawa , et al. August 12, 2 | 2014-08-12 |
| Nondestructive Inspection System Using Nuclear Resonance Fluorescence App 20120002783 - Toyokawa; Hiroyuki ; et al. | 2012-01-05 |
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