Toyoda; Yasutaka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Toyoda; Yasutaka.The latest application filed is for "dimension measurement apparatus, dimension measurement program, and semiconductor manufacturing system".

Company Profile

12.66.71

Toyoda; Yasutaka - Tokyo JP
Toyoda; Yasutaka - Hyogo JP
Toyoda; Yasutaka - Himeji JP
Toyoda; Yasutaka - Mito N/A JP
Toyoda; Yasutaka - Himeji-shi JP
Toyoda; Yasutaka - Hitachi JP
Toyoda, Yasutaka - Hitachi-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Dimension Measurement Apparatus, Dimension Measurement Program, And Semiconductor Manufacturing System App 20220139788 - Okuyama; Yutaka ; et al.	2022-05-05
Structure Estimation System and Structure Estimation Program App 20220130027 - FUKUDA; Muneyuki ; et al.	2022-04-28
Image Evaluation Apparatus and Image Evaluation Method App 20220067902 - DOU; Shuyang ; et al.	2022-03-03
Image Processing System And Computer Program For Performing Image Processing App 20220036116 - SHINODA; Shinichi ; et al.	2022-02-03
Pattern Inspection System App 20210383524 - DOU; Shuyang ; et al.	2021-12-09
Image Recognition Device And Method App 20210374403 - YUMIBA; Ryou ; et al.	2021-12-02
Image processing system and computer program for performing image processing Grant 11,176,405 - Shinoda , et al. November 16, 2	2021-11-16
Pattern inspection system Grant 11,132,788 - Dou , et al. September 28, 2	2021-09-28
Money handling machine and money handling system Grant 11,049,351 - Toyoda June 29, 2	2021-06-29
Image evaluation method and image evaluation device Grant 10,937,146 - Shinoda , et al. March 2, 2	2021-03-02
Semiconductor measurement apparatus and computer program Grant 10,643,326 - Toyoda , et al.	2020-05-05
Image Processing System And Computer Program For Performing Image Processing App 20200134355 - SHINODA; Shinichi ; et al.	2020-04-30
Pattern Inspection System App 20200074611 - DOU; Shuyang ; et al.	2020-03-05
Exposure condition evaluation device Grant 10,558,127 - Shinoda , et al. Feb	2020-02-11
Pattern Evaluation Apparatus and Computer Program App 20200033122 - TOYODA; Yasutaka ; et al.	2020-01-30
Pattern-measuring apparatus and semiconductor-measuring system Grant 10,445,875 - Toyoda , et al. Oc	2019-10-15
Image Evaluation Method and Image Evaluation Device App 20190228522 - SHINODA; Shinichi ; et al.	2019-07-25
Money Handling Machine And Money Handling System App 20190197812 - TOYODA; Yasutaka ; et al.	2019-06-27
Dimension measuring apparatus and computer readable medium Grant 10,317,203 - Minakawa , et al.	2019-06-11
Pattern measurement condition setting device and pattern measuring device Grant 10,190,875 - Shinoda , et al. Ja	2019-01-29
Pattern-measuring device and computer program Grant 10,180,317 - Toyoda , et al. Ja	2019-01-15
Pattern-Measuring Apparatus and Semiconductor-Measuring System App 20180247400 - TOYODA; Yasutaka ; et al.	2018-08-30
Pattern-measuring apparatus and semiconductor-measuring system Grant 9,990,708 - Toyoda , et al. June 5, 2	2018-06-05
Pattern inspecting and measuring device and program Grant 9,858,659 - Minakawa , et al. January 2, 2	2018-01-02
Pattern sensing device and semiconductor sensing system Grant 9,846,931 - Toyoda , et al. December 19, 2	2017-12-19
Image evaluation apparatus and pattern shape evaluation apparatus Grant 9,830,705 - Shinoda , et al. November 28, 2	2017-11-28
Exposure Condition Evaluation Device App 20170336717 - SHINODA; Shinichi ; et al.	2017-11-23
Pattern Measurement Condition Setting Device And Pattern Measuring Device App 20170160082 - SHINODA; Shinichi ; et al.	2017-06-08
Pattern-Measuring Device and Computer Program App 20160356598 - TOYODA; Yasutaka ; et al.	2016-12-08
Money handling machine, money handling system and money handling method Grant 9,495,844 - Toyoda , et al. November 15, 2	2016-11-15
Money handling machine, money handling system, money handling method and valuable-medium handling machine Grant 9,396,620 - Takayama , et al. July 19, 2	2016-07-19
Pattern-Measuring Apparatus and Semiconductor-Measuring System App 20160005157 - TOYODA; Yasutaka ; et al.	2016-01-07
Image processing apparatus Grant 9,183,622 - Toyoda , et al. November 10, 2	2015-11-10
Image Evaluation Apparatus And Pattern Shape Evaluation Apparatus App 20150287201 - Shinoda; Shinichi ; et al.	2015-10-08
Pattern matching method, image processing device, and computer program Grant 9,141,879 - Ushiba , et al. September 22, 2	2015-09-22
Pattern Inspecting and Measuring Device and Program App 20150228063 - Minakawa; Tsuyoshi ; et al.	2015-08-13
Money Handling Machine, Money Handling System And Money Handling Method App 20150206402 - Toyoda; Yasutaka ; et al.	2015-07-23
Pattern shape evaluation method and pattern shape evaluation apparatus Grant 8,977,034 - Toyoda , et al. March 10, 2	2015-03-10
Pattern Sensing Device and Semiconductor Sensing System App 20150016709 - Toyoda; Yasutaka ; et al.	2015-01-15
Semiconductor Measurement Apparatus and Computer Program App 20150009319 - Toyoda; Yasutaka ; et al.	2015-01-08
Method of creating template for matching, as well as device for creating template Grant 8,867,818 - Matsuoka , et al. October 21, 2	2014-10-21
Money Handling Machine, Money Handling System, Money Handling Method And Valuable-medium Handling Machine App 20140224614 - Takayama; Atsushi ; et al.	2014-08-14
Pattern inspection method, pattern inspection apparatus and pattern processing apparatus Grant 8,705,841 - Shinoda , et al. April 22, 2	2014-04-22
Image processing apparatus, image processing method, and image processing program Grant 8,687,921 - Shinoda , et al. April 1, 2	2014-04-01
Pattern generating apparatus and pattern shape evaluating apparatus Grant 8,655,050 - Toyoda , et al. February 18, 2	2014-02-18
Pattern inspection method, pattern inspection program, and electronic device inspection system Grant 8,653,456 - Toyoda , et al. February 18, 2	2014-02-18
Dimension Measuring Apparatus And Computer Readable Medium App 20130325397 - Minakawa; Tsuyoshi ; et al.	2013-12-05
Pattern Generating Apparatus And Pattern Shape Evaluating Apparatus App 20130315468 - TOYODA; Yasutaka ; et al.	2013-11-28
Method and apparatus for image generation Grant 8,577,125 - Shinoda , et al. November 5, 2	2013-11-05
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 8,577,124 - Toyoda , et al. November 5, 2	2013-11-05
Image Processing Apparatus And Computer Program App 20130279793 - Toyoda; Yasutaka ; et al.	2013-10-24
Pattern Matching Method, Image Processing Device, And Computer Program App 20130216141 - Ushiba; Hiroyuki ; et al.	2013-08-22
Pattern generating apparatus and pattern shape evaluating apparatus Grant 8,515,155 - Toyoda , et al. August 20, 2	2013-08-20
Image inspection apparatus Grant 8,498,489 - Abe , et al. July 30, 2	2013-07-30
Method For Creating Template For Patternmatching, And Image Processing Apparatus App 20130170757 - Shinoda; Shinichi ; et al.	2013-07-04
Pattern Generating Apparatus And Pattern Shape Evaluating Apparatus App 20130136335 - Toyoda; Yasutaka ; et al.	2013-05-30
Pattern measurement apparatus Grant 8,445,871 - Matsuoka , et al. May 21, 2	2013-05-21
Pattern Shape Evaluation Method, Pattern Shape Evaluation Device, Pattern Shape Evaluating Data Generation Device And Semiconductor Shape Evaluation System Using The Same App 20130117723 - TOYODA; Yasutaka ; et al.	2013-05-09
Pattern generating apparatus and pattern shape evaluating apparatus Grant 8,363,923 - Toyoda , et al. January 29, 2	2013-01-29
Pattern shape evaluation method Grant 8,355,562 - Toyoda , et al. January 15, 2	2013-01-15
Fracture Surface Analysis System and Method of Fracture Surface Analysis App 20130013223 - Hirano; Atsuya ; et al.	2013-01-10
Image Processing Apparatus, Image Processing Method, and Image Processing Program App 20130011080 - Shinoda; Shinichi ; et al.	2013-01-10
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 8,338,804 - Morokuma , et al. December 25, 2	2012-12-25
Pattern Inspection Method, Pattern Inspection Program, and Electronic Device Inspection System App 20120305767 - Toyoda; Yasutaka ; et al.	2012-12-06
Pattern Measuring Condition Setting Device App 20120290990 - Toyoda; Yasutaka ; et al.	2012-11-15
Pattern Matching Method, Pattern Matching Program, Electronic Computer, and Electronic Device Testing Apparatus App 20120182415 - Toyoda; Yasutaka ; et al.	2012-07-19
Pattern inspection method and pattern inspection system Grant 8,217,351 - Toyoda , et al. July 10, 2	2012-07-10
Method Of Creating Template For Matching, As Well As Device For Creating Template App 20120121160 - Matsuoka; Ryoichi ; et al.	2012-05-17
Pattern Shape Evaluation Method And Pattern Shape Evaluation Apparatus App 20120106826 - Toyoda; Yasutaka ; et al.	2012-05-03
Method And Apparatus Of Pattern Inspection And Semiconductor Inspection System Using The Same App 20120099781 - TOYODA; Yasutaka ; et al.	2012-04-26
Method And Device For Creating Composite Image App 20120092482 - Shinoda; Shinichi ; et al.	2012-04-19
Image processing method for determining matching position between template and search image Grant 8,139,868 - Abe , et al. March 20, 2	2012-03-20
Pattern Generating Apparatus And Pattern Shape Evaluating Apparatus App 20120057774 - TOYODA; Yasutaka ; et al.	2012-03-08
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 8,115,169 - Toyoda , et al. February 14, 2	2012-02-14
Bill recognizing and counting apparatus Grant 8,100,245 - Numata , et al. January 24, 2	2012-01-24
Pattern generating apparatus and pattern shape evaluating apparatus Grant 8,077,962 - Toyoda , et al. December 13, 2	2011-12-13
Pattern matching apparatus and scanning electron microscope using the same Grant 8,041,104 - Toyoda , et al. October 18, 2	2011-10-18
Pattern matching apparatus and semiconductor inspection system using the same Grant 7,991,218 - Toyoda , et al. August 2, 2	2011-08-02
Pattern inspection apparatus and semiconductor inspection system Grant 7,978,904 - Toyoda , et al. July 12, 2	2011-07-12
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20110158543 - Morokuma; Hidetoshi ; et al.	2011-06-30
Pattern Inspection Method, Pattern Inspection Apparatus And Pattern Processing Apparatus App 20110142326 - Shinoda; Shinichi ; et al.	2011-06-16
Image Inspection Apparatus App 20110110597 - Abe; Yuichi ; et al.	2011-05-12
Inspection apparatus using template matching method using similarity distribution Grant 7,925,076 - Abe , et al. April 12, 2	2011-04-12
Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatus Grant 7,923,703 - Morokuma , et al. April 12, 2	2011-04-12
Composite Picture Forming Method And Picture Forming Apparatus App 20110074817 - Shinoda; Shinichi ; et al.	2011-03-31
Bill Recognizing And Counting Apparatus App 20110004336 - Numata; Toshio ; et al.	2011-01-06
Pattern Inspection Method and Pattern Inspection System App 20100310180 - TOYODA; Yasutaka ; et al.	2010-12-09
Pattern inspection method and pattern inspection system Grant 7,786,437 - Toyoda , et al. August 31, 2	2010-08-31
Pattern Measurement Apparatus App 20100202654 - MATSUOKA; Ryoichi ; et al.	2010-08-12
Pattern measurement apparatus Grant 7,732,792 - Matsuoka , et al. June 8, 2	2010-06-08
Sample Dimension Inspecting/measuring Method And Sample Dimension Inspecting/measuring Apparatus App 20090218491 - Morokuma; Hidetoshi ; et al.	2009-09-03
Pattern Generating Apparatus And Pattern Shape Evaluating Apparatus App 20090202139 - TOYODA; Yasutaka ; et al.	2009-08-13
Method And Apparatus For Image Generation App 20090202137 - Shinoda; Shinichi ; et al.	2009-08-13
Method And Apparatus Of Pattern Inspection And Semiconductor Inspection System Using The Same App 20090152463 - TOYODA; Yasutaka ; et al.	2009-06-18
Inspection Apparatus and Method App 20090087103 - Abe; Yuichi ; et al.	2009-04-02
Method and apparatus of pattern inspection and semiconductor inspection system using the same Grant 7,507,961 - Toyoda , et al. March 24, 2	2009-03-24
Pattern Shape Evaluation Method, Pattern Shape Evaluation Device, Pattern Shape Evaluating Data Generation Device And Semiconductor Shape Evaluation System Using The Same App 20090052765 - TOYODA; Yasutaka ; et al.	2009-02-26
Pattern Inspection Method and Pattern Inspection System App 20090039261 - Toyoda; Yasutaka ; et al.	2009-02-12
Pattern Measurement Apparatus App 20090039263 - MATSUOKA; Ryoichi ; et al.	2009-02-12
Pattern Inspection Apparatus and Semiconductor Inspection System App 20080175469 - TOYODA; Yasutaka ; et al.	2008-07-24
Image signal processing method, image signal processing device, and image signal processing system Grant 7,369,284 - Inuzuka , et al. May 6, 2	2008-05-06
Inspection Apparatus Using Template Matching Method Using Similarity Distribution App 20080069453 - Abe; Yuichi ; et al.	2008-03-20
Method and apparatus for measuring three-dimensional shape of specimen by using SEM Grant 7,230,243 - Tanaka , et al. June 12, 2	2007-06-12
Pattern matching apparatus and semiconductor inspection system using the same App 20070098248 - Toyoda; Yasutaka ; et al.	2007-05-03
Method and apparatus of pattern inspection and semiconductor inspection system using the same App 20070023653 - Toyoda; Yasutaka ; et al.	2007-02-01
Image formation apparatus Grant 7,151,619 - Toyoda , et al. December 19, 2	2006-12-19
Image display system and image information transmission method Grant 7,084,850 - Hiyama , et al. August 1, 2	2006-08-01
Display apparatus App 20060097968 - Yamamoto; Tsunenori ; et al.	2006-05-11
Pattern matching apparatus and scanning electron microscope using the same App 20060045326 - Toyoda; Yasutaka ; et al.	2006-03-02
Image display system Grant 6,992,676 - Inuzuka , et al. January 31, 2	2006-01-31
Method and apparatus for measuring three-dimensional shape of specimen by using SEM App 20050285034 - Tanaka, Maki ; et al.	2005-12-29
Image display system and image information transmission method App 20050253798 - Hiyama, Ikuo ; et al.	2005-11-17
Image display system App 20050012754 - Inuzuka, Tatsuki ; et al.	2005-01-20
Image display system Grant 6,784,891 - Inuzuka , et al. August 31, 2	2004-08-31
Image formation apparatus Grant 6,700,680 - Toyoda , et al. March 2, 2	2004-03-02
Image formation apparatus App 20030081257 - Toyoda, Yasutaka ; et al.	2003-05-01
Image formation apparatus App 20030081259 - Toyoda, Yasutaka ; et al.	2003-05-01
Image processing apparatus and image processing method App 20030067616 - Toyoda, Yasutaka ; et al.	2003-04-10
Image display system App 20020118183 - Inuzuka, Tatsuki ; et al.	2002-08-29
Image display system and image information transmission method App 20020105506 - Hiyama, Ikuo ; et al.	2002-08-08

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